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2015 | OriginalPaper | Buchkapitel

Efficient Selection of Time Samples for Higher-Order DPA with Projection Pursuits

verfasst von : François Durvaux, François-Xavier Standaert, Nicolas Veyrat-Charvillon, Jean-Baptiste Mairy, Yves Deville

Erschienen in: Constructive Side-Channel Analysis and Secure Design

Verlag: Springer International Publishing

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Abstract

The selection of points-of-interest in leakage traces is a frequently neglected problem in the side-channel literature. However, it can become the bottleneck of practical adversaries/evaluators as the size of the measurement traces increases, especially in the challenging context of masked implementations, where only a combination of multiple shares reveals information in higher-order statistical moments. In this paper, we describe new (black box) tools for efficiently dealing with this problem. The proposed techniques exploit projection pursuits and specialized local search algorithms, work with minimum memory requirements and practical time complexity. We validate them with two case-studies of unprotected and first-order masked implementations in an 8-bit device, the latter one being hard to analyze with previously known methods.

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Fußnoten
1
Of course, a trivial solution would be to apply PCA/LDA to “product traces” containing all the possible products of d-tuples, but this rapidly leads to unrealistic memory requirements in the masked software context that we consider next.
 
2
More precise estimates can be obtained with Fisher’s Z transform.
 
3
At most linearly since the benefit of increasing the window length \(W_{len}\) saturates whenever it is not negligible in front of the number of samples in the traces \(N_s\).
 
4
For convenience, and in order to limit our measurement needs, we estimated a 4th-order success rate which corresponds to an adversary able to enumerate \(2^{32}\) keys.
 
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Metadaten
Titel
Efficient Selection of Time Samples for Higher-Order DPA with Projection Pursuits
verfasst von
François Durvaux
François-Xavier Standaert
Nicolas Veyrat-Charvillon
Jean-Baptiste Mairy
Yves Deville
Copyright-Jahr
2015
DOI
https://doi.org/10.1007/978-3-319-21476-4_3

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