Anzeige
Erschienen in:
2007 | OriginalPaper | Buchkapitel
Atomic Resolution Transmission Electron Microscopy
verfasst von : Angus I. Kirkland, Shery L. -Y. Chang, John L. Hutchison
Erschienen in: Science of Microscopy
Verlag: Springer New York
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
High-Resolution Transmission Electron Microscopy (HRTEM) uses a self-supporting thin sample (typically tens of nanometes) illuminated by a highly collimated kilovolt electron beam. A series of magnetic electron lenses image the electron wavefield across the exit face of the sample onto a detector at high magnification. HRTEM has evolved from initial instrumentation constructed by Knoll and Ruska (1932a–c) to its current state where individual atom columns in a wide range of materials can be routinely imaged (Smith, 1997; Krakow et al., 1984) using sophisticated computer-controlled microscopes (Figure 1–1). For this reason HRTEM now occupies a central place in many characterization laboratories worldwide and has made a substantial contribution to key areas of materials science, physics, and chemistry [for key examples showing its wide ranging influence see the frontispiece in the book by Spence (2002)]. Instrument development for HRTEM also supports a substantial commercial industry of manufacturers.