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Erschienen in:
1998 | OriginalPaper | Buchkapitel
Dimensional Accuracy in X-Ray Computed Tomography Imaging
verfasst von : S. Trent Neel, Roosevelt Gibson, Courtney R. Daniels, Edward L. Klosterman
Erschienen in: Review of Progress in Quantitative Nondestructive Evaluation
Verlag: Springer US
Enthalten in: Professional Book Archive
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X-ray computed tomography (CT) has become an important non-destructive evaluation technique. CT contributes to a wide range of nondestructive evaluation (NDE) applications [1]. These include typical NDE applications (e.g., defect detection and quality control), more advanced NDE applications (e.g., process development and model verification), and the more recent application of CT-based metrology (e.g., geometric inspection and reverse engineering). In the traditional applications of CT, the user is concerned with defect sensitivity, which is a combination of spatial resolution, contrast sensitivity and slice thickness [2]. For CT-based metrology, the term “defect sensitivity” has little meaning; dimensional accuracy of the system becomes paramount.