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Erschienen in:
01.07.2013
Interfacial microstructure and mechanical properties of In–Bi–Sn lead-free solder
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 7/2013
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Abstract
The interfacial microstructure and mechanical properties of a low melting temperature lead-free solder of In-18.75Bi-22.15Sn (in at.%) (In–Bi–Sn) were investigated. The microstructure analysis of bulk In–Bi–Sn revealed that irregular lamellar γ-Sn phases distributed in the In2Bi matrix. There was only a single endothermic peak with an onset temperature of 62 °C on the DSC curve, indicating that In–Bi–Sn is close to a ternary eutectic solder. The ultimate tensile strength of the bulk In–Bi–Sn was 21.76 MP at a strain rate of 10−2s−1 at 25 °C. The elongation of the bulk In–Bi–Sn solder reached 87 %, indicating an excellent ductility of the In–Bi–Sn solder. Two intermetallic compounds (IMCs), needle-like Cu(In,Sn)2 and laminar Cu6(In,Sn)5, formed at the In–Bi–Sn/Cu interface. An IMC layer of polyhedral crystallites of InNi formed at the In–Bi–Sn/Ni interface. The shear strength of Cu/In–Bi–Sn/Cu solder joints was 21.15 MP, and the shear fractograph showed that the ductile fracture with dimples appearance occurred in the solder.