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Erschienen in: Tribology Letters 1/2011

01.01.2011 | Original Paper

Evolution of Wear Characteristics and Frictional Behavior in MEMS Devices

verfasst von: Ghatu Subhash, Alex D. Corwin, Maarten P. de Boer

Erschienen in: Tribology Letters | Ausgabe 1/2011

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Abstract

A surface-micromachined nanotractor device has been used to investigate the tribological behavior of MEMS devices made of polycrystalline silicon. An accelerated wear test, spanning several hundreds of thousands of cycles, was developed to monitor the evolution of wear characteristics and frictional behavior during its operational lifetime. Postmortem microscopic observations of the wear surfaces revealed features that can be categorized into two regimes of wear: (i) adhesion-dominated wear and (ii) third-body wear. The former was characterized by asperity blunting, plastic deformation of asperity peaks, and smearing of fine wear debris into a thin-surface film. With an increased number of wear cycles, the wear mechanism transitioned to the latter regime which consisted of debris agglomeration and material removal through scratches induced by these agglomerates. Finally, it was theorized that one of the agglomerates grows to a large size, adheres to one of the contact surfaces and causes severe wear in a localized region on the counter surface to lock the two surfaces and cause device failure.

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Literatur
1.
Zurück zum Zitat Tanner, D.M., Dugger, M.T.: Wear mechanisms in reliability methodology. In: Proceedings of the SPIE: The International Society for Optical Engineering, vol. 4980, pp. 22–40 (2003) Tanner, D.M., Dugger, M.T.: Wear mechanisms in reliability methodology. In: Proceedings of the SPIE: The International Society for Optical Engineering, vol. 4980, pp. 22–40 (2003)
2.
Zurück zum Zitat Sundararajan, S., Bhushan, B.: Micro/nanoscale tribology of MEMS materials, lubricants and devices. In: Fundamentals of Tribology and Bridging the Gap Between Macro- and Micro/Nanoscales, Proceedings of the NATO Advanced Study Institute, held in Keszthely, Hungary, August 13–25, 2000. Kluwer Academic Publishers, Printed in the Netherlands, pp. 821–850 (2001) Sundararajan, S., Bhushan, B.: Micro/nanoscale tribology of MEMS materials, lubricants and devices. In: Fundamentals of Tribology and Bridging the Gap Between Macro- and Micro/Nanoscales, Proceedings of the NATO Advanced Study Institute, held in Keszthely, Hungary, August 13–25, 2000. Kluwer Academic Publishers, Printed in the Netherlands, pp. 821–850 (2001)
3.
Zurück zum Zitat Knapp, J.A., de Boer, M.P.: Mechanics of microcantilever beams subjected to combined electrostatic and adhesive forces. J. Microelectromech. Syst. 11, 754–764 (2002)CrossRef Knapp, J.A., de Boer, M.P.: Mechanics of microcantilever beams subjected to combined electrostatic and adhesive forces. J. Microelectromech. Syst. 11, 754–764 (2002)CrossRef
4.
Zurück zum Zitat Wang, W., Wang, Y., Bao, H., Xiong, B., Bao, M.: Friction and wear properties in MEMS. Sens. Actuators A 97–98, 486–491 (2002) Wang, W., Wang, Y., Bao, H., Xiong, B., Bao, M.: Friction and wear properties in MEMS. Sens. Actuators A 9798, 486–491 (2002)
5.
Zurück zum Zitat Komvopoulos, K.: Adhesion and friction forces in microelectromechanical systems: mechanisms, measurement, surface modification techniques and adhesion theory. J. Adhes. Sci. Technol. 17, 477–517 (2003)CrossRef Komvopoulos, K.: Adhesion and friction forces in microelectromechanical systems: mechanisms, measurement, surface modification techniques and adhesion theory. J. Adhes. Sci. Technol. 17, 477–517 (2003)CrossRef
6.
Zurück zum Zitat Maboudian, R., Carraro, C.: Surface engineering for reliable operation of MEMS devices. J. Adhes. Sci. Technol. 17, 583–591 (2003)CrossRef Maboudian, R., Carraro, C.: Surface engineering for reliable operation of MEMS devices. J. Adhes. Sci. Technol. 17, 583–591 (2003)CrossRef
7.
Zurück zum Zitat van Spengen, W.M., Puers, R., de Wolf, I.: On the physics of stiction and its impact on the reliability of microstructures. J. Adhes. Sci. Technol. 17, 563–582 (2003)CrossRef van Spengen, W.M., Puers, R., de Wolf, I.: On the physics of stiction and its impact on the reliability of microstructures. J. Adhes. Sci. Technol. 17, 563–582 (2003)CrossRef
8.
Zurück zum Zitat Tas, N.R., Gui, C., Elwenspoek, M.: Static friction in elastic adhesion contacts in MEMS. J. Adhes. Sci. Technol. 17, 547–561 (2003)CrossRef Tas, N.R., Gui, C., Elwenspoek, M.: Static friction in elastic adhesion contacts in MEMS. J. Adhes. Sci. Technol. 17, 547–561 (2003)CrossRef
9.
Zurück zum Zitat Zhao, Y.-P., Wang, L.S., Yu, T.X.: Mechanics of adhesion in MEMS—a review. J. Adhes. Sci. Technol. 17(4), 519–546 (2003)CrossRef Zhao, Y.-P., Wang, L.S., Yu, T.X.: Mechanics of adhesion in MEMS—a review. J. Adhes. Sci. Technol. 17(4), 519–546 (2003)CrossRef
10.
Zurück zum Zitat Tanner, D.M., Parson, T.B., Corwin, A.D., Walraven, J.A., Wittwer, J.W., Boyce, B.L., Winzer, S.R.: Science-based MEMS reliability methodology. Microelectron. Reliab. 47, 1806–1811 (2007)CrossRef Tanner, D.M., Parson, T.B., Corwin, A.D., Walraven, J.A., Wittwer, J.W., Boyce, B.L., Winzer, S.R.: Science-based MEMS reliability methodology. Microelectron. Reliab. 47, 1806–1811 (2007)CrossRef
11.
Zurück zum Zitat Kim, S.H., Asay, D.B., Dugger, M.T.: Nanotribology and MEMS. Nano Today 2, 22–29 (2007)CrossRef Kim, S.H., Asay, D.B., Dugger, M.T.: Nanotribology and MEMS. Nano Today 2, 22–29 (2007)CrossRef
12.
Zurück zum Zitat Bhushan, B.: Nanotribology and nanomechanics in nano/biotechnology. Phil. Trans. R. Soc. A 366, 1499–1537 (2008)CrossRef Bhushan, B.: Nanotribology and nanomechanics in nano/biotechnology. Phil. Trans. R. Soc. A 366, 1499–1537 (2008)CrossRef
13.
Zurück zum Zitat Zanoria, E., Danyluk, S., McNallan, M.: Effects of length, diameter and population density of tribological rolls on friction between self-mated silicon. Wear 181–183, 784–789 (1995) Zanoria, E., Danyluk, S., McNallan, M.: Effects of length, diameter and population density of tribological rolls on friction between self-mated silicon. Wear 181–183, 784–789 (1995)
14.
Zurück zum Zitat Ding, J.-N., Yang, J.-C., Cai, L.: The initial sliding microfriction properties of polysilicon films. Int. J. Nonlinear Sci. Numer. Simul. 3, 519–522 (2002) Ding, J.-N., Yang, J.-C., Cai, L.: The initial sliding microfriction properties of polysilicon films. Int. J. Nonlinear Sci. Numer. Simul. 3, 519–522 (2002)
15.
Zurück zum Zitat Gupta, B.K., Bhushan, B., Chavellier, J.: Modification of tribological properties of silicon by boron ion implantation. Tribol. Trans. 37, 601–607 (1994)CrossRef Gupta, B.K., Bhushan, B., Chavellier, J.: Modification of tribological properties of silicon by boron ion implantation. Tribol. Trans. 37, 601–607 (1994)CrossRef
16.
Zurück zum Zitat Bhushan, B., Li, X.D.: Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microelectromechanical systems devices. J. Mater. Res. 12, 54–63 (1997)CrossRef Bhushan, B., Li, X.D.: Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microelectromechanical systems devices. J. Mater. Res. 12, 54–63 (1997)CrossRef
17.
Zurück zum Zitat Schmid, S.R., Hector, L.G. Jr., Elings, J., Hampel, H., Piehler, H.: Single asperity plowing of metallic and polymeric surfaces in an atomic force microscope: an overview of recent developments. In: Mater. Res. Soc., Fundamentals of Nanoindentation and Nanotribology (USA), pp. 391–397 (1998) Schmid, S.R., Hector, L.G. Jr., Elings, J., Hampel, H., Piehler, H.: Single asperity plowing of metallic and polymeric surfaces in an atomic force microscope: an overview of recent developments. In: Mater. Res. Soc., Fundamentals of Nanoindentation and Nanotribology (USA), pp. 391–397 (1998)
18.
Zurück zum Zitat Chung, K.-H., Jang, C.-E., Kim, D.-E.: Wear characteristics of microscopic bushings for MEMS applications investigated by an AFM. J. Micromech. Microeng. 17, 1877–1887 (2007)CrossRef Chung, K.-H., Jang, C.-E., Kim, D.-E.: Wear characteristics of microscopic bushings for MEMS applications investigated by an AFM. J. Micromech. Microeng. 17, 1877–1887 (2007)CrossRef
19.
Zurück zum Zitat Gatzen, H.H., Beck, M.: Wear of single crystal silicon as a function of surface roughness. Wear 254, 907–910 (2003)CrossRef Gatzen, H.H., Beck, M.: Wear of single crystal silicon as a function of surface roughness. Wear 254, 907–910 (2003)CrossRef
20.
Zurück zum Zitat Beerschwinger, U., Mathieson, D., Reuben, R.L., Yang, S.J.: A study of wear on MEMS contact morphologies. J. Micromech. Microeng. 4, 95–105 (1994)CrossRef Beerschwinger, U., Mathieson, D., Reuben, R.L., Yang, S.J.: A study of wear on MEMS contact morphologies. J. Micromech. Microeng. 4, 95–105 (1994)CrossRef
21.
Zurück zum Zitat Beerschwinger, U., Albrecht, T., Mathieson, D., Reuben, R.L., Yang, S.J., Taghizadeh, M.: Wear at microscopic scales and light loads for MEMS applications. Wear 181, 426–435 (1995) Beerschwinger, U., Albrecht, T., Mathieson, D., Reuben, R.L., Yang, S.J., Taghizadeh, M.: Wear at microscopic scales and light loads for MEMS applications. Wear 181, 426–435 (1995)
22.
Zurück zum Zitat Mehregany, M., Senturia, S.D., Lang, J.H.: Measurement of wear in polysilicon micromotors. IEEE Trans. Electron Devices 39, 1136–1143 (1992)CrossRef Mehregany, M., Senturia, S.D., Lang, J.H.: Measurement of wear in polysilicon micromotors. IEEE Trans. Electron Devices 39, 1136–1143 (1992)CrossRef
23.
Zurück zum Zitat de Boer, M.P., Luck, D.L., Ashurst, W.R., Maboudian, R., Corwin, A.D., Walraven, J.A., Redmond, J.M.: High performance surface-micromachined inchworm actuator. J. Microelectromech. Syst. 13, 63–74 (2004)CrossRef de Boer, M.P., Luck, D.L., Ashurst, W.R., Maboudian, R., Corwin, A.D., Walraven, J.A., Redmond, J.M.: High performance surface-micromachined inchworm actuator. J. Microelectromech. Syst. 13, 63–74 (2004)CrossRef
24.
Zurück zum Zitat Corwin, A.D., de Boer, M.P.: Effect of adhesion on dynamic and static friction in surface micromachining. Appl. Phys. Lett. 84, 2451–2453 (2004)CrossRef Corwin, A.D., de Boer, M.P.: Effect of adhesion on dynamic and static friction in surface micromachining. Appl. Phys. Lett. 84, 2451–2453 (2004)CrossRef
25.
Zurück zum Zitat Guo, Z.S., Meng, Y.G., Su, C.J., Wu, H.: An on-chip micro-friction tester for tribology research of silicon based MEMS devices. Microsyst. Technol. 14, 109–118 (2008)CrossRef Guo, Z.S., Meng, Y.G., Su, C.J., Wu, H.: An on-chip micro-friction tester for tribology research of silicon based MEMS devices. Microsyst. Technol. 14, 109–118 (2008)CrossRef
26.
Zurück zum Zitat Grierson, D.S., Konicek, A.R., Wabiszewski, G.E., Sumant, A.V., de Boer, M.P., Corwin, A.D., Carpick, R.W.: Characterization of microscale wear in a polysilicon-based MEMS device using AFM and PEEM–NEXAFS spectromicroscopy. Tribol. Lett. 36, 233–238 (2009)CrossRef Grierson, D.S., Konicek, A.R., Wabiszewski, G.E., Sumant, A.V., de Boer, M.P., Corwin, A.D., Carpick, R.W.: Characterization of microscale wear in a polysilicon-based MEMS device using AFM and PEEM–NEXAFS spectromicroscopy. Tribol. Lett. 36, 233–238 (2009)CrossRef
27.
Zurück zum Zitat Alsem, D.H., Dugger, M.T., Stach, E.A., Ritchie, R.O.: Micron-scale friction and sliding wear of polycrystalline silicon thin structural films in ambient air. J. Microelectromech. Syst. 17, 1144 (2008) Alsem, D.H., Dugger, M.T., Stach, E.A., Ritchie, R.O.: Micron-scale friction and sliding wear of polycrystalline silicon thin structural films in ambient air. J. Microelectromech. Syst. 17, 1144 (2008)
28.
Zurück zum Zitat Goertz, P., Zhu, X.-Y., Houston, J.E.: Friction, wear and aging of an alkoxy-monolayer boundary lubricant on silicon. Tribol. Lett. 30, 205–213 (2009)CrossRef Goertz, P., Zhu, X.-Y., Houston, J.E.: Friction, wear and aging of an alkoxy-monolayer boundary lubricant on silicon. Tribol. Lett. 30, 205–213 (2009)CrossRef
29.
Zurück zum Zitat Kimberleya, J., Cooneya, R.S., Lambrosa, J., Chasiotis, I., Barker, N.S.: Failure of Au RF-MEMS switches subjected to dynamic loading. Sens Actuators A 154, 140–148 (2009)CrossRef Kimberleya, J., Cooneya, R.S., Lambrosa, J., Chasiotis, I., Barker, N.S.: Failure of Au RF-MEMS switches subjected to dynamic loading. Sens Actuators A 154, 140–148 (2009)CrossRef
30.
Zurück zum Zitat Brown, C., Rezvanian, O., Zikry, M.A., Krim, J.: Temperature dependence of asperity contact and contact resistance in gold RF MEMS switches J. Micromech. Microeng. 19, 025006-1–025006-9 (2009) Brown, C., Rezvanian, O., Zikry, M.A., Krim, J.: Temperature dependence of asperity contact and contact resistance in gold RF MEMS switches J. Micromech. Microeng. 19, 025006-1–025006-9 (2009)
31.
Zurück zum Zitat Rezvanian, O., Zikry, M.A.: Inelastic contact behavior of crystalline asperities in RF MEMS devices. J. Eng. Mater. Technol. 131, 011002-1–011002-10 (2009) Rezvanian, O., Zikry, M.A.: Inelastic contact behavior of crystalline asperities in RF MEMS devices. J. Eng. Mater. Technol. 131, 011002-1–011002-10 (2009)
32.
Zurück zum Zitat Flater, E.E., Corwin, A.D., de Boer, M.P., Carpick, R.W.: In situ wear studies of surface micromachined interfaces subjected to controlled loading. Wear 260, 580–593 (2006)CrossRef Flater, E.E., Corwin, A.D., de Boer, M.P., Carpick, R.W.: In situ wear studies of surface micromachined interfaces subjected to controlled loading. Wear 260, 580–593 (2006)CrossRef
33.
Zurück zum Zitat Hankins, M.G., Resnick, P.J., Clews, P.J., Mayer, T.M., Wheeler, D.R., Tanner, D. M., Plass, R.A.: Vapor deposition of amino-functionalized self-assembled monolayers on MEMS. In: Proceedings of the SPIE, San Francisco, vol. 4980, pp. 238–247 (2003) Hankins, M.G., Resnick, P.J., Clews, P.J., Mayer, T.M., Wheeler, D.R., Tanner, D. M., Plass, R.A.: Vapor deposition of amino-functionalized self-assembled monolayers on MEMS. In: Proceedings of the SPIE, San Francisco, vol. 4980, pp. 238–247 (2003)
34.
Zurück zum Zitat Corwin, A.D., de Boer, M.P.: A linearized method to measure dynamic friction of microdevices. Exp. Mech. 49(3), 395–401 (2008)CrossRef Corwin, A.D., de Boer, M.P.: A linearized method to measure dynamic friction of microdevices. Exp. Mech. 49(3), 395–401 (2008)CrossRef
35.
Zurück zum Zitat Corwin, A.D., de Boer, M.P.: Frictional aging and sliding bifurcation in monolayer-coated micromachines. J. Microelectromech. Syst. 18, 250 (2009)CrossRef Corwin, A.D., de Boer, M.P.: Frictional aging and sliding bifurcation in monolayer-coated micromachines. J. Microelectromech. Syst. 18, 250 (2009)CrossRef
36.
Zurück zum Zitat Corwin, A. D., de Boer, M. P.: Frictional aging, de-aging, and re-aging in a monolayer-coated micromachined interface. Phys Rev. B 81, 174109 (2010)CrossRef Corwin, A. D., de Boer, M. P.: Frictional aging, de-aging, and re-aging in a monolayer-coated micromachined interface. Phys Rev. B 81, 174109 (2010)CrossRef
37.
Zurück zum Zitat Corwin, A.D., de Boer, M.P.: Scripting software for MEMS automation and actuation (2009) (in preparation) Corwin, A.D., de Boer, M.P.: Scripting software for MEMS automation and actuation (2009) (in preparation)
38.
Zurück zum Zitat Sniegowski, J.J., de Boer, M.P.: IC-compatible polysilicon surface micromachining. Annu. Rev. Mater. Sci. 30, 299–333 (2000) Sniegowski, J.J., de Boer, M.P.: IC-compatible polysilicon surface micromachining. Annu. Rev. Mater. Sci. 30, 299–333 (2000)
39.
Zurück zum Zitat Alsem, D.H., Stach, E.A., Dugger, M.T., Enachescu, M., Ritchie, R.O.: An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air. Thin Solid Films 515, 3259–3266 (2007)CrossRef Alsem, D.H., Stach, E.A., Dugger, M.T., Enachescu, M., Ritchie, R.O.: An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air. Thin Solid Films 515, 3259–3266 (2007)CrossRef
Metadaten
Titel
Evolution of Wear Characteristics and Frictional Behavior in MEMS Devices
verfasst von
Ghatu Subhash
Alex D. Corwin
Maarten P. de Boer
Publikationsdatum
01.01.2011
Verlag
Springer US
Erschienen in
Tribology Letters / Ausgabe 1/2011
Print ISSN: 1023-8883
Elektronische ISSN: 1573-2711
DOI
https://doi.org/10.1007/s11249-010-9696-z

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