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Tribology Letters
Erschienen in: Tribology Letters 1/2011

01.01.2011 | Original Paper

A New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error

verfasst von: Yu Liu, Kar Man Leung, Heng-yong Nie, Woon Ming Lau, Jun Yang

Erschienen in: Tribology Letters | Ausgabe 1/2011

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Abstract

A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507–514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever are detected simultaneously. For a T-shape AFM cantilever, the bending is caused by the normal load and the twisting is caused by both the normal and the lateral loads. The twisting generated by the normal load is calibrated in advance. Consequently, the twisting only due to the lateral load can be decoupled from the total lateral voltage signal. And the friction coefficient can be finally determined based on a conversion relationship between the normal and lateral voltage signals of the AFM photodetector. A practical procedure for minimizing Abbé error in friction coefficient measurement has also been introduced. The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale.
Vorheriger Artikel Space Tribometers: Design for Exposed Experiments on Orbit

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Metadaten
Titel
A New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error
verfasst von
Yu Liu
Kar Man Leung
Heng-yong Nie
Woon Ming Lau
Jun Yang
Publikationsdatum
01.01.2011
Verlag
Springer US
Erschienen in
Tribology Letters / Ausgabe 1/2011
Print ISSN: 1023-8883
Elektronische ISSN: 1573-2711
DOI
https://doi.org/10.1007/s11249-010-9699-9

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