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2017 | OriginalPaper | Buchkapitel

5. Magnetic Force Microscopy Characterization of Magnetic Nanowires and Nanotubes

verfasst von : Muhammad Ramzan Tabasum, Fatih Zighem, Luc Piraux, Bernard Nysten

Erschienen in: Magnetic Characterization Techniques for Nanomaterials

Verlag: Springer Berlin Heidelberg

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Abstract

Magnetic force microscopy (MFM) is one of the operational modes of atomic force microscopy (AFM). In this mode, a magnetic probe is brought close to the sample surface and interacts with the magnetic stray fields emanating from the sample. The strength of the local magnetostatic interaction determines the vertical motion of the tip as it scans across the sample. Since early 1990s, it has been widely used in fundamental research on magnetic materials, as well as in the development of magnetic recording components. It has the capacity to map the local stray fields emanating from individual magnetic nanostructures of the sample, hence providing insight into its magnetic behavior.

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Titel: Magnetic Force Microscopy Characterization of Magnetic Nanowires and Nanotubes
verfasst von: Muhammad Ramzan Tabasum
Fatih Zighem
Luc Piraux
Bernard Nysten
Verlag: Springer Berlin Heidelberg
Buch: Magnetic Characterization Techniques for Nanomaterials
Print ISBN: 978-3-662-52779-5

Electronic ISBN: 978-3-662-52780-1

Copyright-Jahr: 2017
DOI: https://doi.org/10.1007/978-3-662-52780-1_5

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