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Abstract
Magnetic materials are one of the most prominent classes of functional materials, as introduced in Sect. 1.3. They are mostly inorganic, metallic or ceramic in nature and typically multicomponent when used in applications (e.g. alloys or intermetallic phases). Their structure can be amorphous or crystalline with grain sizes ranging from a few nanometers (as in high-end nanocrystalline soft magnetic materials) to centimeters (as in grain-oriented transformer steels). They are available as powders, cast, sintered or composite materials, ribbons or even thin films and find a huge variety of applications in transformers, motors, generators, medical system sensors, and microelectronic devices.
The aim of this chapter is to give advice as to which methods are most applicable to determine the characteristic magnetic properties of any of the materials mentioned above. Magnetic thin-film structures have recently gained significant scientific and economic importance. Not only can their properties deviate from the respective bulk materials but novel phenomena can also occur, such as giant and tunnel magneto-resistance, which lead to their application in read heads and their likely future application to nonvolatile magnetic solid-state memory (MRAM). Therefore, we have added a section that explains the important peculiarities special to thin films, in which we summarize the most relevant measurement techniques.
Section 10.1 will give a short overview to enable the reader to differentiate between the various manifestations of magnetism, different materials and their related properties. For a deeper understanding, of course, textbooks should be used (see the references given in Sect. 10.2). Section 10.2 covers the standard measurement techniques for soft and hard magnetic materials. The tables at the beginning of Sect. 10.2.1 are a valuable guide to choose the best technique for any given property to be measured. It is anticipated that this chapter will cover theoverwhelming needs for a routine characterization of soft and hard magnetic materials in their various forms. Section 10.3 introduces an elegant, novel and extremely fast technique, the so-called pulse field magnetometer, to measure the hysteresis loop of hard magnetic materials and thereby to determine the remanent magnetization, the anisotropy field and coercivity, respectively. This method has been developed only recently and is not yet comprehensively covered in textbooks. It is therefore described in more detail with a critical discussion of possible measurement errors and calibration requirements. Finally, as mentioned above, Sect. 10.4 addresses features peculiar to magnetic thin films and recommends techniques for their magnetic characterization. It comprises an overview of magneto-resistive effects occurring in magnetic thin films or multilayers where the electrical resistivity depends on external magnetic fields. These devices find important applications as read heads in hard-disc drives and as sensors in the automotive and automation industries. The standard measurement to determine the field response (change in resistance within a given field range) is simply a resistivity measurement, as described in Chap. 9, except that it needs to be done in an external magnetic field. These electrical techniques are therefore not covered in this chapter.
In bulk and thin-film ferromagnets properties such as remanent magnetization and coercivity often depend on the time scale used in the measurement (Sects. 10.1.6, 10.3.3). Time-dependent measurements needed, e.g., to predict the stability of the material in applications are not explicitly described in this chapter since, in principle, any sensitive magnetometer can be used for these measurements. In research, sophisticated methods are used to resolve magnetization dynamics on pico- or even femtosecond time scales. A detailed description of these more specialized methods is beyond the scope of this handbook.
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