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Measurement Techniques

Ausgabe 12/1999

Inhalt (18 Artikel)

General Problems of Metrology and Measurement Technique

Processing of measurement data in six-port reflectometry

O. V. Sadkova, S. M. Nikulin

General Problems of Metrology and Measurement Technique

Measurement design for evaluation of measurement results characterized by dispersion

N. G. Nazarov

General Problems of Metrology and Measurement Technique

Digital piecewise-polynomial approximators of the first and second orders for function reproduction

V. V. Chekushkin

General Problems of Metrology and Measurement Technique

Selection and design of multisection smoothing filters for data converters

E. G. Abarinov, I. V. Murinov

General Problems of Metrology and Measurement Technique

Effectiveness of selective measurement systems

V. N. Zybov

General Problems of Metrology and Measurement Technique

On the algebraic foundations of optical measurements

A. V. Pavlov

Linear and Angular Measurements

Metrological complex for transmission of length units in the range of 0.001–50 m

G. P. Pushkarev, V. S. Kupko, V. A. Risto, V. V. Sobol’

Linear and Angular Measurements

A general-purpose three-position sensor

S. S. Babaev

Optophysical Measurements

Changes in emission characteristics of light-emitting diodes under variation of internal factors and pulse-excitation parameters

G. A. Sukach, P. F. Oleksenko, A. V. Bushma, V. Yu. Goroneskul’

Mechanical Measurements

Automated system for measurement of vibration characteristics of small units

V. G. Atavin, A. A. Mokhnatov, Yu. V. Khudyakov, E. F. Yurchik

Thermophysical Measurements

Nonlinearity of transformation characteristic of thin-wire bolometer for focused laser radiation

V. M. Kuz’michev, S. V. Pogorelov

Electromagnetic Measurements

EMF spectra of ferromagnetic steels

G. M. Popov

Radio Measurements

Estimation of tunneling-barrier width in scanning tunneling microscope from noise characteristics

S. A. Bychikhin, V. V. Potemkin, A. V. Stepanov

Physicochemical Measurements

“AKVA” general-purpose automated voltammetric complex for electrochemical research and analysis

V. I. Kenzin, A. P. Zamyatin, R. Yu. Bek, S. P. Novitskii