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Erschienen in: Measurement Techniques 1/2014

01.04.2014 | STATE STANDARDS

National Primary Standard for the Units of Complex Dielectric Permittivity in the Frequency Range from 1 to 178.4 Ghz

verfasst von: V. N. Egorov, M. V. Kashchenko, V. L. Masalov, E. Yu. Tokareva, Nong Quoc Quang

Erschienen in: Measurement Techniques | Ausgabe 1/2014

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Abstract

The composition of the national primary standard for the units of complex dielectric permittivity in the frequency range from 1 to 178.4 GHz and the methods for reproduction and transfer of these units are discussed. The method for digital processing of the characteristics of the measurement cavities used in the standard is described. The metrological characteristics of the standard and some results from measurements of the dielectric parameters of standard gauges are presented.

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Literatur
1.
Zurück zum Zitat GOST 27496.2-87, Electrical Insulating Materials. Methods of Determining Their Dielectric Properties at Frequencies above 300 MHz. Resonance Techniques. GOST 27496.2-87, Electrical Insulating Materials. Methods of Determining Their Dielectric Properties at Frequencies above 300 MHz. Resonance Techniques.
2.
Zurück zum Zitat GOST R 8.623-2006, GSI. Relative Dielectric Permittivity and Dielectric Loss Tangent of Solid Dielectrics. Measurement Techniques for Microwave Frequencies. GOST R 8.623-2006, GSI. Relative Dielectric Permittivity and Dielectric Loss Tangent of Solid Dielectrics. Measurement Techniques for Microwave Frequencies.
3.
Zurück zum Zitat IEC 61338-1-3, Waveguide Type Dielectric Resonators. Part 1–3. General Information and Test Conditions. Measurement Method of Complex Relative Permittivity for Dielectric Resonator Materials at Microwave Frequency. IEC 61338-1-3, Waveguide Type Dielectric Resonators. Part 1–3. General Information and Test Conditions. Measurement Method of Complex Relative Permittivity for Dielectric Resonator Materials at Microwave Frequency.
4.
Zurück zum Zitat IEC 62562-2010, Cavity Resonator Method to Measure the Complex Permittivity of Low-Loss Dielectric Plates. IEC 62562-2010, Cavity Resonator Method to Measure the Complex Permittivity of Low-Loss Dielectric Plates.
5.
Zurück zum Zitat IEC 60377-2, Methods for the Determination of the Dielectric Properties of Insulating Materials at Frequencies above 300 MHz. Part 2. Resonance Methods. IEC 60377-2, Methods for the Determination of the Dielectric Properties of Insulating Materials at Frequencies above 300 MHz. Part 2. Resonance Methods.
6.
Zurück zum Zitat V. N. Egorov, “Resonance methods for studying dielectrics at microwave frequencies (review),” Prib. Tekhn. Eksperim., 50, No. 2, 5–38 (2007). V. N. Egorov, “Resonance methods for studying dielectrics at microwave frequencies (review),” Prib. Tekhn. Eksperim., 50, No. 2, 5–38 (2007).
7.
Zurück zum Zitat V. N. Egorov and M. V. Kashchenko, “Measurement of small dielectric losses in a cavity resonator,” Izmer. Tekhn., No. 1, 61–65 (2002); Measur. Techn., 45, No. 1, 93–101 (2002). V. N. Egorov and M. V. Kashchenko, “Measurement of small dielectric losses in a cavity resonator,” Izmer. Tekhn., No. 1, 61–65 (2002); Measur. Techn., 45, No. 1, 93–101 (2002).
8.
Zurück zum Zitat V. N. Egorov, M. V. Kashchenko, and R. R. Onkhonov, “Accuracy of dielectric measurements in a cylindrical cavity H 01r resonator,” Izmer. Tekhn., No. 10, 41–45 (2003); Measur. Techn., 46, No. 10, 972–978 (2003). V. N. Egorov, M. V. Kashchenko, and R. R. Onkhonov, “Accuracy of dielectric measurements in a cylindrical cavity H 01r resonator,” Izmer. Tekhn., No. 10, 41–45 (2003); Measur. Techn., 46, No. 10, 972–978 (2003).
9.
Zurück zum Zitat V. N. Egorov and E. Yu. Tokareva, “Metal-dielectric resonator method of measuring the parameters of radio materials,” Izmer. Tekhn., No. 9, 65–70 (2005); Measur. Techn., 48, No. 9, 934–943 (2005). V. N. Egorov and E. Yu. Tokareva, “Metal-dielectric resonator method of measuring the parameters of radio materials,” Izmer. Tekhn., No. 9, 65–70 (2005); Measur. Techn., 48, No. 9, 934–943 (2005).
10.
Zurück zum Zitat V. F. Vzyatyshev and V. N. Dobromyslov, “Disk dielectric resonator method for measuring high quality dielectrics in the millimeter wavelength range,” Elektrotekhn. Prom. Kabel. Tekhn., Iss. 10(164), 6–8 (1978). V. F. Vzyatyshev and V. N. Dobromyslov, “Disk dielectric resonator method for measuring high quality dielectrics in the millimeter wavelength range,” Elektrotekhn. Prom. Kabel. Tekhn., Iss. 10(164), 6–8 (1978).
11.
Zurück zum Zitat V. N. Egorov and V. V. Kostromin, “Method for measuring tan™ of polymers in the millimeter wavelength range at temperatures of 4.2–350 K,” Elektron. Tekhn. Elektron. SVCh, Iss. 10(414), 34–37 (1988). V. N. Egorov and V. V. Kostromin, “Method for measuring tan™ of polymers in the millimeter wavelength range at temperatures of 4.2–350 K,” Elektron. Tekhn. Elektron. SVCh, Iss. 10(414), 34–37 (1988).
12.
Zurück zum Zitat A. L. Gullen, “Millimeter-wave open resonator techniques,” Infrar. Millim. Waves, 10, Pt. 2, 233–281 (1983). A. L. Gullen, “Millimeter-wave open resonator techniques,” Infrar. Millim. Waves, 10, Pt. 2, 233–281 (1983).
13.
Zurück zum Zitat V. N. Egorov, “Characteristics of microwave resonators with nonresonant power leakage,” Izv. Vyssh. Ucheb. Zaved. Radiofiz., No. 8, 493–503 (2010). V. N. Egorov, “Characteristics of microwave resonators with nonresonant power leakage,” Izv. Vyssh. Ucheb. Zaved. Radiofiz., No. 8, 493–503 (2010).
14.
Zurück zum Zitat GOST 8.381-2009, GSI. Standards. Methods of Expressing Accuracy. GOST 8.381-2009, GSI. Standards. Methods of Expressing Accuracy.
15.
Zurück zum Zitat RMG 43-2001, GSI. Use of the Guide to the Expression of Uncertainty in Measurement. RMG 43-2001, GSI. Use of the Guide to the Expression of Uncertainty in Measurement.
16.
Zurück zum Zitat M. V. Balakhanov et al., Electronics Standards for Scientific and Engineering Priority Areas and the Latest Technologies, Izd. VNIIFTRI, Mendeleevo (2012). M. V. Balakhanov et al., Electronics Standards for Scientific and Engineering Priority Areas and the Latest Technologies, Izd. VNIIFTRI, Mendeleevo (2012).
Metadaten
Titel
National Primary Standard for the Units of Complex Dielectric Permittivity in the Frequency Range from 1 to 178.4 Ghz
verfasst von
V. N. Egorov
M. V. Kashchenko
V. L. Masalov
E. Yu. Tokareva
Nong Quoc Quang
Publikationsdatum
01.04.2014
Verlag
Springer US
Erschienen in
Measurement Techniques / Ausgabe 1/2014
Print ISSN: 0543-1972
Elektronische ISSN: 1573-8906
DOI
https://doi.org/10.1007/s11018-014-0398-z

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