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Optical and Quantum Electronics

Erschienen in:

01.01.2023

Optoelectronic properties and defect analysis for PVA/Cu nanocomposites films

verfasst von: M. M. Ali, S. A. Abdelsalam, O. M. Hemeda, T. Sharshar, A. M. A. Henaish

Erschienen in: Optical and Quantum Electronics | Ausgabe 1/2023

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Abstract

The characterization of polymeric nanocomposite thin films of polyvinyl alcohol (PVA) doped with various concentrations of copper nanoparticles (Cu–NPs) by the aid of casting technique is synthesis and detailed. The PVA/Cu nanocomposite thin films are containing wt.% = 0%, 0.04%, 0.08%, and 0.1% of (Cu–NPs). The X-ray diffraction (XRD) exhibits the semi-crystalline behavior of all polymeric films. The Fourier transform Infrared (FTIR) results show some remarkable changes in the spectral characteristics of the thin films after adding (Cu–NPs) to (PVA) solution. Scanning electron microscopy (SEM) shows partial homogeneity between the polymeric matrix and the nano filler. The Ultraviolet–Visible (UV–Vis) spectroscopy is used to measure the optical parameters. Tauc and Urbach models are used to predict optical bandgap energy (E_g), Urbach energy (E_u), and optoelectronic properties of PVA/ Cu–NPs nanocomposites. The dielectric characteristics of the nanocomposite thin films show an improvement when the nano-filler is added to the polymeric matrix. The changes in microstructure of the PVA/Cu–NPs composite thin films are analyzed by the positron annihilation lifetime (PAL) and the Doppler broadening (DB) techniques.

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Titel: Optoelectronic properties and defect analysis for PVA/Cu nanocomposites films
verfasst von: M. M. Ali
S. A. Abdelsalam
O. M. Hemeda
T. Sharshar
A. M. A. Henaish
Publikationsdatum: 01.01.2023
Verlag: Springer US
Erschienen in: Optical and Quantum Electronics / Ausgabe 1/2023
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI: https://doi.org/10.1007/s11082-022-04320-4

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