2001 | OriginalPaper | Buchkapitel
Oxidation of H-Terminated Silicon
verfasst von : H. Nohira, T. Hattori
Erschienen in: Fundamental Aspects of Silicon Oxidation
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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Recently, the densities, functions and operating speeds of integrated circuits driven by ever-increasing numbers of metal-oxide-semiconductor field-effect transistors (MOSFETs) have increased remarkably to produce not only ultrahigh-speed computers, but also many intelligent operating systems. This is largely a result of continuing progress in Si single-crystal growth and Si-related process and microfabrication technologies for integrated circuits. It is made possible by the stable electrical and thermal properties of Si-Si02 systems and the abundant silicon resources on the earth.