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This journal features top papers in pattern recognition, image recognition, analysis, understanding, and processing. Pattern Recognition and Image Analysis places emphasis on the rapid publishing of concise articles covering theory, methodology, and practical applications. Major topics include mathematical theory of pattern recognition, raw data representation, computer vision, image processing, machine learning, computer graphics, data and knowledge bases, neural nets, software, specialized computer architectures, applications, and related areas.
The Editorial Board is headed by Yuri Zhuravlev, a prominent Russian mathematician, and Full Member of the Russian Academy of Sciences. The board also includes distinguished scientists and engineers from the Russian Academy of Sciences, CIS universities and industry, as well as internationally recognized experts in the field from the USA and Europe. The authors are experts in research and applications.