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Erschienen in:
1989 | OriginalPaper | Buchkapitel
Promise and Pitfalls of WSI
verfasst von : Joe E. Brewer
Erschienen in: Wafer Scale Integration
Verlag: Springer US
Enthalten in: Professional Book Archive
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Wafer scale integration has had several serious trials, and each time it has failed. After each failure there has been a period of critical review; and then, like the phoenix, a new set of innovators and investors rise from the ashes to make yet another attempt. By itself, this very process is informative. Talented people do not invest their time and money in ill conceived enterprises. They believed the risks could be managed, and that the prize was worth the effort.