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2004 | OriginalPaper | Buchkapitel

RF Parameter Extraction for HEMTs and HBTs

verfasst von : Dr. techn.Dipl.-Ing. Vassil Palankovski, Dr. techn.Dipl.-Phys. Rüdiger Quay

Erschienen in: Analysis and Simulation of Heterostructure Devices

Verlag: Springer Vienna

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This chapter addresses the extraction of RF quantities such as Y- and related parameters, derived quantities such as stability factors and cut-off frequencies, and, last but not least, small-signal equivalent circuit elements for various topologies. It further provides a view of the physical understanding of the bias dependence of small-signal equivalent circuit elements in HEMTs and HBTs in analytcial models and TCAD approaches.

Metadaten
Titel
RF Parameter Extraction for HEMTs and HBTs
verfasst von
Dr. techn.Dipl.-Ing. Vassil Palankovski
Dr. techn.Dipl.-Phys. Rüdiger Quay
Copyright-Jahr
2004
Verlag
Springer Vienna
DOI
https://doi.org/10.1007/978-3-7091-0560-3_4

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