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Erschienen in:
2011 | OriginalPaper | Buchkapitel
RFID-Based Critical Path Expert System for Agility Manufacture Process Management
verfasst von : Haifang Cheng, Yuli Xiang
Erschienen in: Intelligent Computing and Information Science
Verlag: Springer Berlin Heidelberg
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This paper presents a critical path expert system for the agility manufacture process management based on radio frequency identification (RFID) technology. The paper explores that the agility manufacture processes can be visible and controllable with RFID. The critical paths or activities can be easily found out and tracked by the RFID tracing technology. And the expert system can optimize the bottle neck of the task process of the agility management with the critical path adjusting and reforming method. Finally, the paper gives a simple application example of the system to discuss how to adjust the critical paths and how to make the process more agility and flexibility with the critical path expert system. With an RFID-based critical path expert system, the agility manufacture process management will be more effective and efficient.