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Erschienen in:

2019 | OriginalPaper | Buchkapitel

7. Scattering and Reflection

verfasst von : Hideki Matsuoka

Erschienen in: Molecular Soft-Interface Science

Verlag: Springer Japan

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Abstract

Using scattering techniques, we can obtain information of nanostructure of soft matters by measuring the angular dependence (or time fluctuation in dynamic method) of scattered lights, with laser, X-ray, or neutron as an incident beam. For polymers, micelles, and colloids in solution or dispersion, their size and shape can be evaluated, and also occasionally higher order structure such as a spatial distribution of these solutes in solution can be estimated for concentrated systems. The typical optical arrangement of a scattering technique is shown in this chapter. Reflection of X-ray or neutron provides us information of nanostructure on the surfaces and interfaces also in nanometer scale. It is very useful for structural studies of polymer thin films, monolayers, and LB films.

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Vorheriges Kapitel Surface Analysis

Nächstes Kapitel X-Ray and Neutron Reflectivity and Grazing Incidence X-Ray Diffraction

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Titel: Scattering and Reflection
verfasst von: Hideki Matsuoka
Verlag: Springer Japan
Buch: Molecular Soft-Interface Science
Print ISBN: 978-4-431-56875-9

Electronic ISBN: 978-4-431-56877-3

Copyright-Jahr: 2019
DOI: https://doi.org/10.1007/978-4-431-56877-3_7

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