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Tribology Letters
Erschienen in: Tribology Letters 2/2014

01.05.2014 | Original Paper

Stability and Structure of Nanometer-Thin Perfluoropolyether Films Using Molecular Simulations

verfasst von: Taeil Yi, Uma Shantini Ramasamy, Seth Lichter, Ashlie Martini

Erschienen in: Tribology Letters | Ausgabe 2/2014

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Abstract

Methods to determine the stability of thin films are needed to ensure that lubricating layers maintain their integrity and so can reliably protect and lubricate moving interfaces. Here, we compare two models of perfluoropolyether and various methods of calculating disjoining pressure as a means of characterizing stability using molecular dynamics simulation. As has been shown previously, we find that energy methods, based on the variation of film--substrate interaction energy with film thickness, provide a good estimate of disjoining pressure. Further, we find that more rapid computational methods based on the density in the film, though they may yield a poorer estimate of the magnitude of the disjoining pressure, yield correct predictions for thin film stability.
Vorheriger Artikel Effect of Titanium and Nitrogen Additions on the Microstructures and Three-Body Abrasive Wear Behaviors of Fe–B Cast Alloys
Nächster Artikel Luminescent Molecular Sensors for Assessment of Temperature Field in Machining

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Metadaten
Titel
Stability and Structure of Nanometer-Thin Perfluoropolyether Films Using Molecular Simulations
verfasst von
Taeil Yi
Uma Shantini Ramasamy
Seth Lichter
Ashlie Martini
Publikationsdatum
01.05.2014
Verlag
Springer US
Erschienen in
Tribology Letters / Ausgabe 2/2014
Print ISSN: 1023-8883
Elektronische ISSN: 1573-2711
DOI
https://doi.org/10.1007/s11249-014-0316-1

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