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Erschienen in:
01.02.2017
Structural, morphological, optical and hologram recording of the CdS and ZnS thin films by double exposure digital holographic interferometry technique
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 10/2017
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Abstract
In this paper, we have used double exposure digital holographic interferometry (DEDHI) technique for hologram recording of electrochemical synthesis of the CdS and ZnS thin films materials. As synthesis CdS and ZnS thin films are characterized by different characterization techniques such as X-ray diffraction (XRD), Field emission scanning electron microscopy (FE-SEM), optical band gap, and contact angle measurement. Further recording of the holograms has been carried out with different deposition time of CdS and ZnS thin films, and we have used mathematical relation between stress, mass deposited thickness of thin film and fringe width. It is seen that the fringe width, mas of deposited samples, stress to substrate changes with the time of deposition.