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2016 | OriginalPaper | Buchkapitel

34. Study of Trap Density Effect on Current Voltage Characteristics of SubPc and C60 Organic Semiconductors for Photovoltaic Application

verfasst von : Mebarka Daoudi, Nesrine Mendil, Zakarya Berkai, Abderrahmane Belghachi

Erschienen in: Renewable Energy in the Service of Mankind Vol II

Verlag: Springer International Publishing

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Abstract

Our work is focussed on the effect of trap density on the current density−voltage characterization of organic active layers chloro(subphthalocyaninato)boron (SubPc) or fullerene (C60), in which SubPc and C60 were applied as the donor and acceptor materials, respectively. The results show that at high voltage ( > 0.17 V) the trap density affected J−V dramatically. Our results are in good agreement with those by Holmes et al. (Adv Funct Mater 22:617–624, 2012)

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Metadaten
Titel
Study of Trap Density Effect on Current Voltage Characteristics of SubPc and C60 Organic Semiconductors for Photovoltaic Application
verfasst von
Mebarka Daoudi
Nesrine Mendil
Zakarya Berkai
Abderrahmane Belghachi
Copyright-Jahr
2016
DOI
https://doi.org/10.1007/978-3-319-18215-5_34