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01.03.2024

Surface color estimation in 3D spatial coordinate remote sensing by a technical vision system

verfasst von: Wendy Flores-Fuentes, Eduardo Arellano-Vega, Oleg Sergiyenko, Iván Y. Alba-Corpus, Julio C. Rodríguez-Quiñonez, Moises J. Castro-Toscano, Félix F. González-Navarro, S. Vasavi, Jesús E. Miranda-Vega, Daniel Hernández-Balbuena, Fabián N. Murrieta-Rico, Moisés Rivas-López

Erschienen in: Optical and Quantum Electronics | Ausgabe 3/2024

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Abstract

This paper proposes to enhance the capabilities of a Technical Vision System (TVS) based on optical scanning and dynamic triangulation for 3D spatial coordinates measurements to determine and add to the record of its measurements the color of the objects coordinates scanned. Optoelectronics signals output from the TVS scanning aperture contain a huge amount of data that cannot be friendly or obvious to human understanding and interpretation. However, time domain characteristic parameters can be extracted from the optoelectronics signals, which can describe aspects of the optoelectronic signal and the 3D spatial coordinate to whom it belongs; that is, it is specific and punctual information from the area of the object under scanning. In this theoretical and experimental evaluation, the parameters obtained from optoelectronics signals have been used as feature inputs for supervised learning and as an approach to implement artificial intelligence to the TVS signal processing by a model able to predict in real time the color of the 3D spatial coordinates measured.

Vorheriger Artikel Bifurcations, chaotic behavior, sensitivity analysis and soliton solutions of the extended Kadometsev–Petviashvili equation

Nächster Artikel Attenuated solitons through some dispersion profiles in a tapered inhomogeneous fiber with erbium effect

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Titel: Surface color estimation in 3D spatial coordinate remote sensing by a technical vision system
verfasst von: Wendy Flores-Fuentes
Eduardo Arellano-Vega
Oleg Sergiyenko
Iván Y. Alba-Corpus
Julio C. Rodríguez-Quiñonez
Moises J. Castro-Toscano
Félix F. González-Navarro
S. Vasavi
Jesús E. Miranda-Vega
Daniel Hernández-Balbuena
Fabián N. Murrieta-Rico
Moisés Rivas-López
Publikationsdatum: 01.03.2024
Verlag: Springer US
Erschienen in: Optical and Quantum Electronics / Ausgabe 3/2024
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI: https://doi.org/10.1007/s11082-023-05646-3

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