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Erschienen in:
2005 | OriginalPaper | Buchkapitel
SVM Based Regression Schemes for Instruments Fault Accommodation in Automotive Systems
verfasst von : Domenico Capriglione, Claudio Marrocco, Mario Molinara, Francesco Tortorella
Erschienen in: Image Analysis and Processing – ICIAP 2005
Verlag: Springer Berlin Heidelberg
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The paper deals with the use of Support Vector Machines (SVMs) and performance comparisons with Artificial Neural Networks (ANNs) in software-based Instrument Fault Accommodation schemes. As an example, a real case study on an automotive systems is presented. The ANNs and SVMs regression capability are employed to accommodate faults that could occur on main sensors involved in the operating engine. The obtained results prove the good behaviour of both tools and similar performances have been achieved in terms of accuracy.