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Optical and Quantum Electronics

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01.05.2024

Synergistic effect of zirconia reinforcement in SrTiO₃-borosilicate glasses for radiation shielding applications

verfasst von: Rajat Kumar Mishra, Shweta, Chandkiram Gautam

Erschienen in: Optical and Quantum Electronics | Ausgabe 5/2024

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Abstract

Radiation shielding plays a crucial role in safeguarding human health, and ongoing research is exploring alternative materials for this vital purpose. Herein, physical and radiation-shielding features of the manufactured glasses via melt-quenching technique doped with ZrO₂ within a glassy system, (100-x-y)[SrTiO₃]-x[2B₂O₃·SiO₂]-y(ZrO₂), (39 ≤ x ≤ 40, and 0 ≤ y ≤ 4 mol % ZrO₂) were studied. The density (ρ) and field-strength (F_s) values of the synthesized glasses were found to be in an increasing order of 2.6068–3.0720 g/cm³ and 5.2401–14.2399 Å⁻² respectively. The study also encompassed an exploration of the radiation shielding properties such as mass attenuation coefficient (MAC), linear attenuation coefficient (LAC), half value length, tenth value length, mean free path, effective atomic number (Z_eff), and effective electron-density (N_eff) of the synthesized glasses, employing the freely available ‘Phy-X/PSD’ software within the energy range of 0.015–15 MeV. The highest values of MAC, LAC, and N_eff at 0.02 MeV were found to be 25.275 cm²/g, 77.644 cm⁻¹, and 8.42 × 10²³ electrons/g for SrTZ4 (x = 39 and y = 4) glass respectively. Notably, among all the fabricated glasses, SrTZ4 emerged as the standout performer, demonstrating superior gamma-radiation protecting abilities along with effective physical properties. Thus, the fabricated SrTZ4 glass with its remarkable radiation shielding properties holds promising applications for the development of radiation protection equipment.

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Titel: Synergistic effect of zirconia reinforcement in SrTiO3-borosilicate glasses for radiation shielding applications
verfasst von: Rajat Kumar Mishra
Shweta
Chandkiram Gautam
Publikationsdatum: 01.05.2024
Verlag: Springer US
Erschienen in: Optical and Quantum Electronics / Ausgabe 5/2024
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI: https://doi.org/10.1007/s11082-024-06464-x

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