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Temporal Relations of Rough Anti-patterns in Software Development

verfasst von : Łukasz Puławski

Erschienen in: Rough Sets

Verlag: Springer International Publishing

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Abstract

Design anti-patterns are common wrong solutions in software, whose frequency has been proven to be correlated with poor system quality. This paper investigates temporal relations between different types of anti-patters, i.e. how the appearance of one type of anti-pattern in the source code increases the probability that different anti-pattern will appear shortly after in its neighbourhood. The notion of rough anti-pattern used to model the vagueness of anti-patterns allows us to reformulate the question and establish if certain rough patterns tend to be temporally correlated. The proposed framework was used to build a classifier, which can be employed to predict the appearance of some anti-patterns by looking at the temporal relations between other anti-patterns. The experiments conducted on two large open-source projects suggest that a few common anti-patterns tend to be temporally dependent on others, whereas a few others do not.

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Please recall from Sect. 2.3 that we can treat SSN as a labeled multi-graph.

Please note different symbols: \(\mathcal {P}(X)\) denotes the set of sub-graphs of X, while P(Y) denotes the power-set of Y.

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Titel: Temporal Relations of Rough Anti-patterns in Software Development
verfasst von: Łukasz Puławski
Verlag: Springer International Publishing
Buch: Rough Sets
Print ISBN: 978-3-319-60836-5

Electronic ISBN: 978-3-319-60837-2

Copyright-Jahr: 2017
DOI: https://doi.org/10.1007/978-3-319-60837-2_37

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