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Erschienen in: International Journal of Machine Learning and Cybernetics 2/2024

01.08.2023 | Original Article

TFEN: two-stage feature enhancement network for single-image super-resolution

verfasst von: Shuying Huang, Houzeng Lai, Yong Yang, Weiguo Wan, Wei Li

Erschienen in: International Journal of Machine Learning and Cybernetics | Ausgabe 2/2024

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Abstract

In recent years, deep convolution neural networks have made significant progress in single-image super-resolution (SISR). However, high-resolution (HR) images obtained by most SISR reconstruction methods still suffer from edge blur-ring and texture distortion. To address this issue, we propose a two-stage feature enhancement network (TFEN) for the SISR reconstruction to realize nonlinear mapping from low-resolution (LR) images to HR images. In the first stage, an initial feature reconstruction module (IFRM) is constructed by combining a feature attention enhancement block and multiple convolution layers that simulate degradation and reconstruction operations to reconstruct a coarse HR image. In the second stage, based on the extracted features and the coarse HR image in the first stage, multiple residual attention modules (RAMs) consisting of the proposed spatial feature enhancement blocks (SFEBs) and an attention interaction block (AIB) are cascaded to generate the final HR image. In RAM, the SFEB is designed to learn more refined features for the reconstruction by adopting dilated convolutions and constructing spatial feature enhancement block, and the AIB is built to enhance the important features learned by RAMs through constructing multi-directional attention maps. Extensive experiments show that the proposed method has better performance than some current state-of-the-art SISR networks.

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Metadaten
Titel
TFEN: two-stage feature enhancement network for single-image super-resolution
verfasst von
Shuying Huang
Houzeng Lai
Yong Yang
Weiguo Wan
Wei Li
Publikationsdatum
01.08.2023
Verlag
Springer Berlin Heidelberg
Erschienen in
International Journal of Machine Learning and Cybernetics / Ausgabe 2/2024
Print ISSN: 1868-8071
Elektronische ISSN: 1868-808X
DOI
https://doi.org/10.1007/s13042-023-01928-0

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