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Erschienen in: Journal of Materials Science: Materials in Electronics 9/2013

01.09.2013

The effects of solder deformation on the wetting characteristics and interfacial reaction of Sn–3.5Ag solders on Cu substrates in fluxless soldering

verfasst von: Jeong Hwan Lee, Sung Woo Ma, Young Min Kim, Jin Su Lee, Ki Bum Kim, Jae Myun Kim, Jae Sung Oh, Namseog Kim, Young-Ho Kim

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2013

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Abstract

The effects of solder deformation on the wetting characteristics during fluxless soldering were studied when deformed Sn–3.5Ag solder balls were reacted with Cu or oxidized Cu substrates. The Cu surfaces were oxidized at 100 °C for 2 or 4 h in air. After the 760 μm diameter solder balls were deformed on the substrates under 0–30 N, they were then reflowed at 300 °C for 30 s without flux. An optical microscope and a scanning electron microscope equipped with energy dispersive spectroscopy were used to measure the wetting angles and to characterize interfacial microstructures. As solder deformation increased, the wetting angle of solder bumps on the Cu or oxidized Cu substrates decreased and the spreading area increased. The oxide layer on the Cu surface decreased the wettability of the solders. Intermetallic compound (IMC) growth was suppressed in the solder interface when the solder reacted with oxidized Cu, while the IMC thickness increased with solder deformation. Solder deformation exposed a fresh Sn surface and improved contact between the solder and Cu substrate, thereby increasing the wettability of the solders.

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Literatur
3.
4.
Zurück zum Zitat P.T. Vianco, D.R. Frear, J. Miner, Met. Mater. Soc. 45, 14–19 (1993)CrossRef P.T. Vianco, D.R. Frear, J. Miner, Met. Mater. Soc. 45, 14–19 (1993)CrossRef
5.
Zurück zum Zitat S.M. Hong, C.S. Kang, J.P. Jung, IEEE Trans. Adv. Packag. 27, 90–96 (2004)CrossRef S.M. Hong, C.S. Kang, J.P. Jung, IEEE Trans. Adv. Packag. 27, 90–96 (2004)CrossRef
6.
7.
Zurück zum Zitat W.W. So, C.C. Lee, IEEE Trans. Comp. Packag. Technol. 23, 377–382 (2000)CrossRef W.W. So, C.C. Lee, IEEE Trans. Comp. Packag. Technol. 23, 377–382 (2000)CrossRef
8.
Zurück zum Zitat N. Koopman, S. Bobbio, S. Nangalia, J. Bousaba, B. Piekarski, in Proceedings of Electronic Components and Technology Conference, Orlando, USA, 1–4 June, 1993, pp. 595–605 N. Koopman, S. Bobbio, S. Nangalia, J. Bousaba, B. Piekarski, in Proceedings of Electronic Components and Technology Conference, Orlando, USA, 1–4 June, 1993, pp. 595–605
9.
Zurück zum Zitat K. Sakuma, K. Toriyama, H. Noma, et al., in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 31 May–03 June, 2011, pp. 7–13 K. Sakuma, K. Toriyama, H. Noma, et al., in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 31 May–03 June, 2011, pp. 7–13
10.
Zurück zum Zitat C.C. Dong, A. Schwarz, D.V. Roth, Proceedings of Nepcon Malaysia, vol. 97 (Kuala Lumpur, Malaysia, 1997) C.C. Dong, A. Schwarz, D.V. Roth, Proceedings of Nepcon Malaysia, vol. 97 (Kuala Lumpur, Malaysia, 1997)
11.
Zurück zum Zitat C.C. Dong, R.E. Patrick, E.J. Karwacki, IEEE Trans. Adv. Packag. 30, 485–490 (2007)CrossRef C.C. Dong, R.E. Patrick, E.J. Karwacki, IEEE Trans. Adv. Packag. 30, 485–490 (2007)CrossRef
12.
Zurück zum Zitat K.M. Harr, Y.M. Kim, D.H. Lim, Y.-H. Kim, J.G. Kim, S. Yi, in Proceedings of Electronic Components and Technology Conference, San Diego, USA, 26–29 May, 2009, pp. 1475–1478 K.M. Harr, Y.M. Kim, D.H. Lim, Y.-H. Kim, J.G. Kim, S. Yi, in Proceedings of Electronic Components and Technology Conference, San Diego, USA, 26–29 May, 2009, pp. 1475–1478
13.
Zurück zum Zitat C.T. Lin, K.L. Lin, J. Mater. Sci.: Mater. Electron. 15, 757–762 (2005)CrossRef C.T. Lin, K.L. Lin, J. Mater. Sci.: Mater. Electron. 15, 757–762 (2005)CrossRef
14.
Zurück zum Zitat H. Liu, K. Wang, K. Aasmundtveit, N. Hoivik, J. Electron. Mater. 41, 1–10 (2012) H. Liu, K. Wang, K. Aasmundtveit, N. Hoivik, J. Electron. Mater. 41, 1–10 (2012)
15.
Zurück zum Zitat M. O’reilly, X. Jiang, J. Beechinor et al., Appl. Surf. Sci. 91, 152–156 (1995)CrossRef M. O’reilly, X. Jiang, J. Beechinor et al., Appl. Surf. Sci. 91, 152–156 (1995)CrossRef
16.
Zurück zum Zitat T. Suga, H. Ozaki, H. Ozawa, in Proceedings of Electronic Components and Technology Conference, San Diego, USA, 30 May–02 June, 2006, pp. 129–132 T. Suga, H. Ozaki, H. Ozawa, in Proceedings of Electronic Components and Technology Conference, San Diego, USA, 30 May–02 June, 2006, pp. 129–132
17.
19.
Zurück zum Zitat C.-J. Zhan, J.-Y. Juang, Y.-M. Lin, Y.-W. Huang, K.-S Kao, T.-F. Yang, S.-T. Lu, J.H. Lau, in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 31 May–03 June, 2011, pp. 14–21 C.-J. Zhan, J.-Y. Juang, Y.-M. Lin, Y.-W. Huang, K.-S Kao, T.-F. Yang, S.-T. Lu, J.H. Lau, in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 31 May–03 June, 2011, pp. 14–21
20.
Zurück zum Zitat D. Saint-Patrice, F. Marion, M. Fendler, G. Dumont, J. Garrione, V. Mandrillon, F. Greco, M. Diop, C. Largeron, H. Ribot, in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 27–30 May, 2008, pp. 46–53 D. Saint-Patrice, F. Marion, M. Fendler, G. Dumont, J. Garrione, V. Mandrillon, F. Greco, M. Diop, C. Largeron, H. Ribot, in Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, USA, 27–30 May, 2008, pp. 46–53
Metadaten
Titel
The effects of solder deformation on the wetting characteristics and interfacial reaction of Sn–3.5Ag solders on Cu substrates in fluxless soldering
verfasst von
Jeong Hwan Lee
Sung Woo Ma
Young Min Kim
Jin Su Lee
Ki Bum Kim
Jae Myun Kim
Jae Sung Oh
Namseog Kim
Young-Ho Kim
Publikationsdatum
01.09.2013
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 9/2013
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-013-1238-7

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