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Optical and Quantum Electronics
Erschienen in: Optical and Quantum Electronics 1/2017

01.01.2017

Tight focusing properties of phase modulated transversely polarized sinh Gaussian beam

verfasst von: C. Mohana Sundaram, K. Prabakaran, P. M. Anbarasan, K. B. Rajesh, A. Mohamed Musthafa, V. Aroulmoji

Erschienen in: Optical and Quantum Electronics | Ausgabe 1/2017

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Abstract

We studied the tight focusing properties of an azimuthally polarized sinh-Gaussian beam phase modulated with multi belt vortex phase filter on the basis of the vector diffraction theory. The sinh-Gaussian beam can be considered as superposition of a series of eccentric Gaussian beams and it is observed that focusing such a beam with a properly designed dedicated vortex phase filter generates many novel focal patterns including transversely polarized optical needle of extended focal depth with sub wavelength scale lateral resolution and mutiple focal spots with different axial seperation distance. We expect that such a focal patterns are usefull in applications such as semiconductor inspection and multiple optical trapping.
Vorheriger Artikel Analytical prediction of coupling losses in bend silicon subwavelength optical interconnect
Nächster Artikel Tm-fiber pumped single-longitudinal-mode Ho:LuVO4 laser

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Metadaten
Titel
Tight focusing properties of phase modulated transversely polarized sinh Gaussian beam
verfasst von
C. Mohana Sundaram
K. Prabakaran
P. M. Anbarasan
K. B. Rajesh
A. Mohamed Musthafa
V. Aroulmoji
Publikationsdatum
01.01.2017
Verlag
Springer US
Erschienen in
Optical and Quantum Electronics / Ausgabe 1/2017
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-016-0857-7

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