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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 19/2019

05.09.2019

Ultrathin bismuth oxyhalides solid solution nanosheets with oxygen vacancies for enhanced selective photocatalytic NO removal process

verfasst von: Xian Shi, Pingquan Wang, Kai Zhang, Xing Li

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 19/2019

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Abstract

Photocatalytic NO removal is an oxidation reaction where the NO2 or NO3− can be generated during the selective or non-selective NO removal process. For enhanced photocatalytic NO removal ability, photocatalysts were required stronger molecular oxygen activation activity for stronger oxidizability. Solid solution structure is confirmed as an efficient strategy to achieve induced molecular oxygen activation capacity. In this work, ultrathin structural BiOBr0.5I0.5 with oxygen vacancies (BiOBr0.5I0.5-U) was prepared and it showed obvious enhanced photocatalytic efficiency for NO removal than unmodified BiOBr0.5I0.5. The photocatalytic NO removal mechanism was confirmed through efficient methods. The enhanced generation ability for superoxide and singlet oxygen due to the ultrathin structure of BiOBr0.5I0.5-U was confirmed evidentially. The improved molecular oxygen activation activity supported the improved selective NO removal efficiency. This study could provide a new thought for the design of efficient bismuth oxyhalide photocatalysts for NO removal.
Vorheriger Artikel Mössbauer studies of mixed-valence manganite Pb3(Mn0.965Fe0.035)7O15
Nächster Artikel Sintering behavior, microwave dielectric properties and thermally stimulated depolarization current behavior of B2O3-doped CoTiNb2O8 ceramics

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Metadaten
Titel
Ultrathin bismuth oxyhalides solid solution nanosheets with oxygen vacancies for enhanced selective photocatalytic NO removal process
verfasst von
Xian Shi
Pingquan Wang
Kai Zhang
Xing Li
Publikationsdatum
05.09.2019
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 19/2019
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-02134-x

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