Anzeige
Erschienen in:
2009 | OriginalPaper | Buchkapitel
Using Convergent-Beam Techniques
verfasst von : David B. Williams, C. Barry Carter
Erschienen in: Transmission Electron Microscopy
Verlag: Springer US
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can’t obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.