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Journal of Materials Science
Erschienen in: Journal of Materials Science 3/2019

12.10.2018 | Electronic materials

Using in operando diffraction to relate lattice strain with degradation mechanism in a NMC battery

verfasst von: Shikhar Krishn Jha, Harry Charalambous, John S. Okasinski, Thomas Tsakalakos

Erschienen in: Journal of Materials Science | Ausgabe 3/2019

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Abstract

Crystallographic structural changes in a commercial 5 Ah prismatic graphite–NMC battery were investigated during its operation using energy-dispersive X-ray diffraction. The characteristic diffraction peaks for the anode and cathode were identified, and their peak positions were linked to the charge–discharge cycle of the battery. The edge of the negative terminal of battery was shown to undergo irregular cycling behavior. Stresses developed at the battery layer interfaces were proposed to be the source for this deterioration, which limits the lifetime of the battery. The effect of pulse discharge on strain in cathode has also been studied.
Vorheriger Artikel Silicon microstructures through the production of silicon nanowires by metal-assisted chemical etching, used as sacrificial material
Nächster Artikel Chemical pressure in the correlated narrow-gap semiconductor FeGa3

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Metadaten
Titel
Using in operando diffraction to relate lattice strain with degradation mechanism in a NMC battery
verfasst von
Shikhar Krishn Jha
Harry Charalambous
John S. Okasinski
Thomas Tsakalakos
Publikationsdatum
12.10.2018
Verlag
Springer US
Erschienen in
Journal of Materials Science / Ausgabe 3/2019
Print ISSN: 0022-2461
Elektronische ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-018-3007-8

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