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Erschienen in: Pattern Analysis and Applications 1/2021

22.09.2020 | Industrial and Commercial Application

Wavelet domain majority coupled binary pattern: a new descriptor for texture classification

verfasst von: S. Nithya, S. Ramakrishnan

Erschienen in: Pattern Analysis and Applications | Ausgabe 1/2021

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Abstract

In this paper, a new approach for texture classification called wavelet domain majority coupled binary pattern is proposed. Here, the single-level wavelet transform is applied which decomposes the image, resulting in wavelet coefficients. The wavelet coefficients present in all the four sub-bands are taken for further processing. The relationship of wavelet coefficients present at distances one, two and three is utilized. The average wavelet coefficients present at various distances are compared with the center wavelet coefficient of the local region, resulting in binary value. For each distance,  eight bit binary pattern is generated. Altogether, three distances yield three eight bit binary pattern. Then, the rule of majority is applied to the three  eight bit binary pattern and results in generation of proposed label. The proposed labels together contribute for the construction of histogram. Finally, the distance measure is used to identify the similarity between query and database images. Experimental results show that the proposed method achieves the average retrieval rate of 88.92% on Brodatz, 93.95% on Outex and 90.53% on Virus databases. This shows that the proposed method achieves good performance and outperforms other existing methods.

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Metadaten
Titel
Wavelet domain majority coupled binary pattern: a new descriptor for texture classification
verfasst von
S. Nithya
S. Ramakrishnan
Publikationsdatum
22.09.2020
Verlag
Springer London
Erschienen in
Pattern Analysis and Applications / Ausgabe 1/2021
Print ISSN: 1433-7541
Elektronische ISSN: 1433-755X
DOI
https://doi.org/10.1007/s10044-020-00907-3

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