2003 | OriginalPaper | Buchkapitel
X-Ray Photoelectron Spectroscopy
verfasst von : M. H. Kibel
Erschienen in: Surface Analysis Methods in Materials Science
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as Photoelectron (PE) Spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called Ultraviolet Photoelectron Spectroscopy (UPS), and the second using X-rays, termed X-ray Photoelectron Spectroscopy (XPS). The latter spectroscopy is the subject of this present chapter, while UPS is discussed in Chap. 14.