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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 18/2019

22.06.2019

A generalized Drude–Lorentz model for refractive index behavior of tellurite glasses

verfasst von: Anderson Gonçalves, Maurício A. Ribeiro, Jaqueline V. Gunha, Aloisi Somer, Vitor S. Zanuto, Nelson G. C. Astrath, Daniele T. Dias, Maike A. F. dos Santos, Carlos Jacinto, Ervin K. Lenzi, Andressa Novatski

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 18/2019

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Abstract

An extension of Drude–Lorentz model based on the fractional approach was used to investigate quantitative measurement of refractive index as a function of wavelength of Tellurite glasses. Tellurite glass samples were synthesized by conventional melt-quenching method with the composition of 65TeO2–15Li2O–20ZnO undoped and doped with different concentrations of Er2O3. Refractive index measurements were performed using the Brewster angle technique with polarized lasers at 442, 532, 594 and 633 nm as light source. From the Sellmeier’s coefficient it was possible to obtain the behavior of refractive index from 0.35 to 1.8 μm. The analytical solution obtained from the generalized Drude–Lorentz model was used to investigate the experimental data of refractive index behavior obtained by the two-pole Sellmeier’s equation showing that the mean polarizability increases with Er2O3 concentration and this behavior can be related to a collective fractal character of the material.
Vorheriger Artikel Prediction of the electrical response of solution-processed thin-film transistors using multifactorial analysis
Nächster Artikel Growth of magnetic cobalt hexacyanoferrate nanoparticles onto bacterial cellulose nanofibers

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Metadaten
Titel
A generalized Drude–Lorentz model for refractive index behavior of tellurite glasses
verfasst von
Anderson Gonçalves
Maurício A. Ribeiro
Jaqueline V. Gunha
Aloisi Somer
Vitor S. Zanuto
Nelson G. C. Astrath
Daniele T. Dias
Maike A. F. dos Santos
Carlos Jacinto
Ervin K. Lenzi
Andressa Novatski
Publikationsdatum
22.06.2019
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 18/2019
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-01696-0

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