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Erschienen in:
Detection and Classification of Power Quality Disturbances Using Variational Mode Decomposition and Deep Learning Networks Kapitel lesen Erstes Kapitel lesen

2024 | OriginalPaper | Buchkapitel

An Insight into Algorithms and Self Repair Mechanism for Embedded Memories Testing

verfasst von : Vinita Mathur, Aditya Kumar Pundir, Sudhanshu Singh, Sanjay Kumar Singh

Erschienen in: Flexible Electronics for Electric Vehicles

Verlag: Springer Nature Singapore

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Abstract

This paper covers the critical review of algorithms related to Memory built-in self-test and repair based on key parameters including area overhead for spare register, memory row/column size, local bits, main memory sizes, testing time penalties, and repair rate. This paper reviews the concept of memories testing BIST and built-in self-memory repair BISR using different RA algorithms in brief. In MBIST March C, March C- and March LR are simulated for different Memory sizes. March LR shows better fault coverage and requires less testing time. For MBISR different repair redundancy algorithms are simulated for various cases of Spare row/column size. CRESTA shows the optimal repair rate as compared to other repair algorithms. In this paper, we have simulated the co-design of MBIST and MBISR March C, March C-, and March LR as base testing algorithms for MBIST and MBISR ESP with a spare row/column of one row and one column with a memory size of 6*6*1. With this implementation, we found that March LR requires less testing time and co-designing of hardware reduces the hardware penalty.

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Vorheriges Kapitel Optimal Reactive Power Dispatch Problem Using Novel Wild Horse-Based Optimizer
Nächstes Kapitel Rapid Protection System Using Single-End Current Data for Capacitive Compensated Power Transmission Network
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Metadaten
Titel
An Insight into Algorithms and Self Repair Mechanism for Embedded Memories Testing
verfasst von
Vinita Mathur
Aditya Kumar Pundir
Sudhanshu Singh
Sanjay Kumar Singh
Copyright-Jahr
2024
Verlag
Springer Nature Singapore
Buch
Flexible Electronics for Electric Vehicles

Print ISBN: 978-981-9947-94-2

Electronic ISBN: 978-981-9947-95-9

Copyright-Jahr: 2024

DOI
https://doi.org/10.1007/978-981-99-4795-9_48