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2021 | OriginalPaper | Buchkapitel

An Online Deep Learning Based System for Defects Detection in Glass Panels

verfasst von : Matteo Moro, Claudio Andreatta, Chiara Corridori, Paolo Rota, Niculae Sebe

Erschienen in: Pattern Recognition. ICPR International Workshops and Challenges

Verlag: Springer International Publishing

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Abstract

Automated surface anomaly inspection for industrial application is assuming every year an increasing importance, in particular, deep learning methods are remarkably suitable for detection and segmentation of surface defects. The identification of flaws and structural weaknesses of glass surfaces is crucial to ensure the quality, and more importantly, guarantee the integrity of the panel itself. Glass inspection, in particular, has to overcome many challenges, given the nature of the material itself and the presence of defects that may occur with arbitrary size, shape, and orientation. Traditionally, glass manufacturers automated inspection systems are based on more conventional machine learning algorithms with handcrafted features. However, considering the unpredictable nature of the defects, manually engineered features may easily fail even in the presence of small changes in the environment conditions. To overcome these problems, we propose an inductive transfer learning application for the detection and classification of glass defects. The experimental results show a comparison among different deep learning single-stage and two-stage detectors. Results are computed on a brand new dataset prepared in collaboration with Deltamax Automazione Srl.

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Literatur
1.
Zurück zum Zitat Tsai, D., Chiang, I., Tsai, Y.: A shift-tolerant dissimilarity measure for surface defect detection. IEEE Trans. Industr. Inf. 8(1), 128–137 (2012)CrossRef Tsai, D., Chiang, I., Tsai, Y.: A shift-tolerant dissimilarity measure for surface defect detection. IEEE Trans. Industr. Inf. 8(1), 128–137 (2012)CrossRef
2.
3.
Zurück zum Zitat He, Z., Sun, L.: Surface defect detection method for glass substrate using improved otsu segmentation. Appl. Opt. 54(33), 9823–9830 (2015)CrossRef He, Z., Sun, L.: Surface defect detection method for glass substrate using improved otsu segmentation. Appl. Opt. 54(33), 9823–9830 (2015)CrossRef
5.
Zurück zum Zitat Oztemel, E., Gursev, S.: Literature review of industry 4.0 and related technologies. J. Intell. Manuf. 31, 127–182 (2020) Oztemel, E., Gursev, S.: Literature review of industry 4.0 and related technologies. J. Intell. Manuf. 31, 127–182 (2020)
6.
Zurück zum Zitat Li, J., Dai, Y., Li, C., Shu, J., Li, D., Yang, T., Lu, Z.: Visual detail augmented mapping for small aerial target detection. Remote Sens. 11, 14 (2018)CrossRef Li, J., Dai, Y., Li, C., Shu, J., Li, D., Yang, T., Lu, Z.: Visual detail augmented mapping for small aerial target detection. Remote Sens. 11, 14 (2018)CrossRef
7.
Zurück zum Zitat Liu, M., Wang, X., Zhou, A., Fu, X., Ma, Y., Piao, C.: Uav-yolo: Small object detection on unmanned aerial vehicle perspective. Sensors 20, 2238 (2020)CrossRef Liu, M., Wang, X., Zhou, A., Fu, X., Ma, Y., Piao, C.: Uav-yolo: Small object detection on unmanned aerial vehicle perspective. Sensors 20, 2238 (2020)CrossRef
8.
Zurück zum Zitat Pham, M.-T., Courtrai, L., Friguet, C., Lefèvre, S., Baussard, A.: Yolo-fine: one-stage detector of small objects under various backgrounds in remote sensing images. Remote Sens. 12, 2501 (2020)CrossRef Pham, M.-T., Courtrai, L., Friguet, C., Lefèvre, S., Baussard, A.: Yolo-fine: one-stage detector of small objects under various backgrounds in remote sensing images. Remote Sens. 12, 2501 (2020)CrossRef
9.
Zurück zum Zitat Krizhevsky, A., Sutskever, I., Hinton, G.: Imagenet classification with deep convolutional neural networks. Neural Inf. Process. Syst. 25, 1097–1105 (2012) Krizhevsky, A., Sutskever, I., Hinton, G.: Imagenet classification with deep convolutional neural networks. Neural Inf. Process. Syst. 25, 1097–1105 (2012)
10.
Zurück zum Zitat Masci, J., Meier, U., Ciresan, D., Schmidhuber, J., Fricout, G.: Steel defect classification with max-pooling convolutional neural networks. In: International Joint Conference on Neural Networks (IJCNN), pp. 1–6 (2012) Masci, J., Meier, U., Ciresan, D., Schmidhuber, J., Fricout, G.: Steel defect classification with max-pooling convolutional neural networks. In: International Joint Conference on Neural Networks (IJCNN), pp. 1–6 (2012)
11.
Zurück zum Zitat Saffari, A., Leistner, C., Santner, J., Godec, M., Bischof, H.: On-line random forests. In: IEEE International Conference on Computer Vision (ICCV), pp. 1393–1400 (2009) Saffari, A., Leistner, C., Santner, J., Godec, M., Bischof, H.: On-line random forests. In: IEEE International Conference on Computer Vision (ICCV), pp. 1393–1400 (2009)
12.
Zurück zum Zitat Suykens, J., Vandewalle, J.: Least squares support vector machine classifiers. Neural Process. Lett. 9, 293–300 (1999)CrossRef Suykens, J., Vandewalle, J.: Least squares support vector machine classifiers. Neural Process. Lett. 9, 293–300 (1999)CrossRef
13.
Zurück zum Zitat Fukunaga, K., Narendra, P.M.: A branch and bound algorithm for computing k-nearest neighbors. IEEE Trans. Comput. C-24(7), 750–753 (1975) Fukunaga, K., Narendra, P.M.: A branch and bound algorithm for computing k-nearest neighbors. IEEE Trans. Comput. C-24(7), 750–753 (1975)
14.
Zurück zum Zitat Zhao, J., Kong, Q.J., Zhao, X., Liu, J., Liu, Y.: A method for detection and classification of glass defects in low resolution images. In: International Conference on Image and Graphics, pp. 642–647 (2011) Zhao, J., Kong, Q.J., Zhao, X., Liu, J., Liu, Y.: A method for detection and classification of glass defects in low resolution images. In: International Conference on Image and Graphics, pp. 642–647 (2011)
15.
Zurück zum Zitat Tabernik, D., Šela, S., Skvarč, J., Skočaj, D.: Segmentation-based deep-learning approach for surface-defect detection. J. Intell. Manuf. 31(3), 759–776 (2019)CrossRef Tabernik, D., Šela, S., Skvarč, J., Skočaj, D.: Segmentation-based deep-learning approach for surface-defect detection. J. Intell. Manuf. 31(3), 759–776 (2019)CrossRef
16.
Zurück zum Zitat Park, J., Riaz, H., Kim, H., Kim, J.: Advanced cover glass defect detection and classification based on multi-dnn model. Manuf. Lett. 23, 53–61 (2019)CrossRef Park, J., Riaz, H., Kim, H., Kim, J.: Advanced cover glass defect detection and classification based on multi-dnn model. Manuf. Lett. 23, 53–61 (2019)CrossRef
17.
Zurück zum Zitat Liu, D., Lai, K., Ye, G., Chen, M., Chang, S.: Sample-specific late fusion for visual category recognition. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 803–810 (2013) Liu, D., Lai, K., Ye, G., Chen, M., Chang, S.: Sample-specific late fusion for visual category recognition. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 803–810 (2013)
18.
Zurück zum Zitat Yao, M., Sharp, C., DeBrunner, L.S., DeBrunner, V.E.: Image processing for a line-scan camera system. In: Asilomar Conference on Signals, Systems and Computers, vol. 1, pp. 130–134 (1996) Yao, M., Sharp, C., DeBrunner, L.S., DeBrunner, V.E.: Image processing for a line-scan camera system. In: Asilomar Conference on Signals, Systems and Computers, vol. 1, pp. 130–134 (1996)
19.
Zurück zum Zitat Wang, C.Y.: et al.: Cspnet: a new backbone that can enhance learning capability of CNN. In: IEEE CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops (2020) Wang, C.Y.: et al.: Cspnet: a new backbone that can enhance learning capability of CNN. In: IEEE CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops (2020)
20.
Zurück zum Zitat Everingham, M., Van Gool, L., Williams, C., Winn, J., Zisserman, A.: The pascal visual object classes (voc) challenge. Int. J. Comput. Vis. 88, 303–338 (2010)CrossRef Everingham, M., Van Gool, L., Williams, C., Winn, J., Zisserman, A.: The pascal visual object classes (voc) challenge. Int. J. Comput. Vis. 88, 303–338 (2010)CrossRef
21.
Zurück zum Zitat Wilson, G., Cook, D.J.: A survey of unsupervised deep domain adaptation. ACM Trans. Intell. Syst. Technol. (TIST) 11(5), 1–46 (2020) Wilson, G., Cook, D.J.: A survey of unsupervised deep domain adaptation. ACM Trans. Intell. Syst. Technol. (TIST) 11(5), 1–46 (2020)
22.
Zurück zum Zitat Girshick, R.: Fast r-cnn. In: IEEE International Conference on Computer Vision (ICCV), pp. 1440–1448 (2015) Girshick, R.: Fast r-cnn. In: IEEE International Conference on Computer Vision (ICCV), pp. 1440–1448 (2015)
23.
Zurück zum Zitat He, K., Gkioxari, G., Dollár, P., Girshick, R.: Mask r-cnn. In: IEEE International Conference on Computer Vision (ICCV), pp. 2980–2988 (2017) He, K., Gkioxari, G., Dollár, P., Girshick, R.: Mask r-cnn. In: IEEE International Conference on Computer Vision (ICCV), pp. 2980–2988 (2017)
24.
Zurück zum Zitat Jocher, G., et al.: ultralytics/yolov5: v3.0 (2020) Jocher, G., et al.: ultralytics/yolov5: v3.0 (2020)
Metadaten
Titel
An Online Deep Learning Based System for Defects Detection in Glass Panels
verfasst von
Matteo Moro
Claudio Andreatta
Chiara Corridori
Paolo Rota
Niculae Sebe
Copyright-Jahr
2021
DOI
https://doi.org/10.1007/978-3-030-68799-1_37

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