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Erschienen in: Journal of Intelligent Manufacturing 1/2022

05.09.2020

Chatter detection for milling using novel p-leader multifractal features

verfasst von: Yun Chen, Huaizhong Li, Liang Hou, Xiangjian Bu, Shaogan Ye, Ding Chen

Erschienen in: Journal of Intelligent Manufacturing | Ausgabe 1/2022

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Abstract

Chatter in machining results in poor workpiece surface quality and short tool life. An accurate and reliable chatter detection method is needed before its complete development. This paper applies a novel p-leader multifractal formalism for chatter detection in milling processes. This novel formalism can discover internal singularities rising on unstable signals due to chatter without prior knowledge of the natural frequencies of the machining system. The p-leader multifractal features are selected by using a multivariate filter method for feature selection, and verified by both numerical simulations and experimental studies with detailed parameter selection discussions when applying this formalism. The proposed method is assessed in terms of their dynamic monitoring abilities and classification accuracies under wide cutting conditions. The results show that the multifractal features can successfully detect chatter with high accuracies and short computation time. For further verification, the proposed method is compared with two commonly-used methods, which indicates that the proposed method gives better classification accuracies, especially when identifying unstable tests.

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Metadaten
Titel
Chatter detection for milling using novel p-leader multifractal features
verfasst von
Yun Chen
Huaizhong Li
Liang Hou
Xiangjian Bu
Shaogan Ye
Ding Chen
Publikationsdatum
05.09.2020
Verlag
Springer US
Erschienen in
Journal of Intelligent Manufacturing / Ausgabe 1/2022
Print ISSN: 0956-5515
Elektronische ISSN: 1572-8145
DOI
https://doi.org/10.1007/s10845-020-01651-5

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