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Erschienen in: Microsystem Technologies 10-11/2011

01.10.2011 | Technical Paper

Comparison of etch characteristics of KOH, TMAH and EDP for bulk micromachining of silicon (110)

verfasst von: Shankar Dutta, Md Imran, P. Kumar, R. Pal, P. Datta, R. Chatterjee

Erschienen in: Microsystem Technologies | Ausgabe 10-11/2011

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Abstract

Bulk micromachining in Si (110) wafer is an essential process for fabricating vertical microstructures by wet chemical etching. We compared the anisotropic etching properties of potassium hydroxide (KOH), tetra-methyl ammonium hydroxide (TMAH) and ethylene di-amine pyro-catechol (EDP) solutions. A series of etching experiments have been carried out using different etchant concentration and temperatures. Etching at elevated temperatures was found to improve the surface quality as well as shorten the etching time in all the etchants. At 120°C, we get a smooth surface (Ra = 21.2 nm) with an etching rate 12.2 μm/min in 40wt% KOH solution. At 125°C, EDP solution (88wt%) was found to produce smoothest surface (Ra = 9.4 nm) with an etch rate of 1.8 μm/min. In TMAH solution (25wt%), the best surface roughness was found to be 35.6 nm (Ra) at 90°C with an etch rate of 1.18 μm/min. The activation energy and pre-exponential factor in Arrhenius relation are also estimated from the corresponding etch rate data.

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Literatur
Zurück zum Zitat Bhandari R, Negi S, Rieth L, Solzbacher F (2010) A wafer-scale etching technique for high aspect ratio implantable MEMS structures. Sens Actuators A 162:130–136CrossRef Bhandari R, Negi S, Rieth L, Solzbacher F (2010) A wafer-scale etching technique for high aspect ratio implantable MEMS structures. Sens Actuators A 162:130–136CrossRef
Zurück zum Zitat Bhat KN, Yellampalle C, DasGupta N, DasGupta A, Rao PRS (2003) Optimization of EDP solutions for feature size independent silicon etching. Proc. SPIE Symposium on Micromachining and Microfabrication 4979:70–78 Bhat KN, Yellampalle C, DasGupta N, DasGupta A, Rao PRS (2003) Optimization of EDP solutions for feature size independent silicon etching. Proc. SPIE Symposium on Micromachining and Microfabrication 4979:70–78
Zurück zum Zitat Biswas K, Kal S (2006) Etch Characteristics of KOH, TMAH and dual doped TMAH for bulk micromachining of silicon. Microelectron J 37:519–525CrossRef Biswas K, Kal S (2006) Etch Characteristics of KOH, TMAH and dual doped TMAH for bulk micromachining of silicon. Microelectron J 37:519–525CrossRef
Zurück zum Zitat Choi WK, Thong JTL, Luo P, Bai Y, Tan CM, Chua TH (1999) Formation of pyramids at surface of TMAH etched silicon. Appl Surf Sci 144:472–475CrossRef Choi WK, Thong JTL, Luo P, Bai Y, Tan CM, Chua TH (1999) Formation of pyramids at surface of TMAH etched silicon. Appl Surf Sci 144:472–475CrossRef
Zurück zum Zitat Dutta S, Pal R, Kumar P, Hooda OP, Singh J, Shaveta SaxenaG, Datta P, Chatterjee R (2009) Fabrication challenges for realization of wet etching based comb type capacitive microaccelerometer structure. Sens Transducers J 111:18–24 Dutta S, Pal R, Kumar P, Hooda OP, Singh J, Shaveta SaxenaG, Datta P, Chatterjee R (2009) Fabrication challenges for realization of wet etching based comb type capacitive microaccelerometer structure. Sens Transducers J 111:18–24
Zurück zum Zitat Lee D, Yu K, Krishnamoorthy U, Solgaard O (2009) Vertical mirror fabrication combining KOH Etch and DRIE of (110) silicon. IEEE J MEMS 18:217–227 Lee D, Yu K, Krishnamoorthy U, Solgaard O (2009) Vertical mirror fabrication combining KOH Etch and DRIE of (110) silicon. IEEE J MEMS 18:217–227
Zurück zum Zitat Ni H, Lee HJ, Ramirez AG (2005) A robust two-step etching process for large-scale microfabricated SiO2 and Si3N4 MEMS membranes. Sens Actuators A 119:553–558CrossRef Ni H, Lee HJ, Ramirez AG (2005) A robust two-step etching process for large-scale microfabricated SiO2 and Si3N4 MEMS membranes. Sens Actuators A 119:553–558CrossRef
Zurück zum Zitat Sato K, Shikida M, Yamashiro T, Tsunekawa M, Ito S (1999) Roughening of single-crystal silicon surface etched by KOH water solution. Sens Actuators A 73:122–130CrossRef Sato K, Shikida M, Yamashiro T, Tsunekawa M, Ito S (1999) Roughening of single-crystal silicon surface etched by KOH water solution. Sens Actuators A 73:122–130CrossRef
Zurück zum Zitat Seidel H, Csepregi L, Heuberger A, Baumgartel H (1990a) Anisotropic etching of crystalline silicon in alkaline solution. Part I. Orientation dependence and behavior of passivation layer. J Electrochem Soc 137:3612–3626CrossRef Seidel H, Csepregi L, Heuberger A, Baumgartel H (1990a) Anisotropic etching of crystalline silicon in alkaline solution. Part I. Orientation dependence and behavior of passivation layer. J Electrochem Soc 137:3612–3626CrossRef
Zurück zum Zitat Seidel H, Csepregi L, Heuberger A, Baumgartel H (1990b) Anisotropic etching of crystalline silicon in alkaline solution. Part II. Influence of dopants. J Electrochem Soc 137:3626–3632CrossRef Seidel H, Csepregi L, Heuberger A, Baumgartel H (1990b) Anisotropic etching of crystalline silicon in alkaline solution. Part II. Influence of dopants. J Electrochem Soc 137:3626–3632CrossRef
Zurück zum Zitat Shikida M, Sato K, Tokoro K, Uchikawa D (2000) Differences in anisotropic etching properties of KOH and TMAH solutions. Sens Actuators A 80:179–188CrossRef Shikida M, Sato K, Tokoro K, Uchikawa D (2000) Differences in anisotropic etching properties of KOH and TMAH solutions. Sens Actuators A 80:179–188CrossRef
Zurück zum Zitat Steinsland E, Nese M, Hanneborg A, Bernstein RW, Sandmo H, Kittilsland G (1996) Boron etch-stop in TMAH solutions. Sens Actuators A 54:728–732CrossRef Steinsland E, Nese M, Hanneborg A, Bernstein RW, Sandmo H, Kittilsland G (1996) Boron etch-stop in TMAH solutions. Sens Actuators A 54:728–732CrossRef
Zurück zum Zitat Steinsland E, Finstad T, Hanneborg A (2000) Etch rates of (100), (111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry. Sens Actuators A 86:73–80CrossRef Steinsland E, Finstad T, Hanneborg A (2000) Etch rates of (100), (111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry. Sens Actuators A 86:73–80CrossRef
Zurück zum Zitat Tanaka H, Yamashita S, Abe Y, Shikida M, Sato K (2004) Fast etching of silicon with smooth surface in high temperature ranges near the boiling point of KOH solution. Sens Actuators A 114:516–520CrossRef Tanaka H, Yamashita S, Abe Y, Shikida M, Sato K (2004) Fast etching of silicon with smooth surface in high temperature ranges near the boiling point of KOH solution. Sens Actuators A 114:516–520CrossRef
Zurück zum Zitat Uenishi Y, Tsugai M, Mehregany M (1995) Micro-opto-mechanical devices fabricated by anisotropic etching of (110) silicon. J Micromech Microeng 5:305–312CrossRef Uenishi Y, Tsugai M, Mehregany M (1995) Micro-opto-mechanical devices fabricated by anisotropic etching of (110) silicon. J Micromech Microeng 5:305–312CrossRef
Zurück zum Zitat Yang CR, Chen PY, Chiou YC, Lee RT (2005) Effects of mechanical agitation and surfactant additive on silicon anisotropic etching in alkaline KOH solution. Sens Actuators A 119:263–270CrossRef Yang CR, Chen PY, Chiou YC, Lee RT (2005) Effects of mechanical agitation and surfactant additive on silicon anisotropic etching in alkaline KOH solution. Sens Actuators A 119:263–270CrossRef
Metadaten
Titel
Comparison of etch characteristics of KOH, TMAH and EDP for bulk micromachining of silicon (110)
verfasst von
Shankar Dutta
Md Imran
P. Kumar
R. Pal
P. Datta
R. Chatterjee
Publikationsdatum
01.10.2011
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 10-11/2011
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-011-1351-6

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