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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 1/2016

10.10.2015

Copper-catalyzed oxidation caused by copper-rich impurities in cross-linked polyethylene cable insulation

verfasst von: Jianying Li, Huan Li, Fusheng Zhou, Shihang Wang, Jiankang Zhao, Benhong Ouyang

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 1/2016

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Abstract

In this paper, the existence of copper-rich impurities in cross-linked polyethylene (XLPE) cable insulation was evidenced by means of thermal-oxidative ageing. It was deduced by the results of DSC tests that copper-rich impurities can lead to decreased melting temperature and crystallinity of XLPE during the thermal-oxidative ageing process. Meanwhile, some cracks in branch-type originating from these impurities, which can be regarded as the generation of increased free volume, were observed by SEM. These results might be induced by enhanced chains scission and crystalline disruption due to copper-rich impurities. It was proposed that these impurities work as potential catalysts in oxidation reaction, resulting in accelerated inhomogeneous deterioration of XLPE. In addition, the Oxidative Induction Time (OIT) of XLPE was measured and it was found that copper-catalyzed oxidation reaction occurs only if the antioxidant in XLPE is nearly exhausted.
Vorheriger Artikel Far infrared reflection study on structure–property relationship of Ba[Mg(1−x)/3ZrxTa2(1−x)/3]O3 ceramics
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Metadaten
Titel
Copper-catalyzed oxidation caused by copper-rich impurities in cross-linked polyethylene cable insulation
verfasst von
Jianying Li
Huan Li
Fusheng Zhou
Shihang Wang
Jiankang Zhao
Benhong Ouyang
Publikationsdatum
10.10.2015
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 1/2016
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3820-7

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