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Journal of Electronic Testing
Erschienen in: Journal of Electronic Testing 1/2014

01.02.2014

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

verfasst von: Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor

Erschienen in: Journal of Electronic Testing | Ausgabe 1/2014

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Abstract

The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we will present, in detail, all types of counterfeits, the defects present in them, and their detection methods. We will then describe the challenges to implementing these test methods and to their effectiveness. We will present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.
Vorheriger Artikel Test Technology Newsletter
Nächster Artikel A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment

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Metadaten
Titel
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
verfasst von
Ujjwal Guin
Daniel DiMase
Mohammad Tehranipoor
Publikationsdatum
01.02.2014
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 1/2014
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5430-8

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