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Erschienen in: Journal of Computational Electronics 5/2021

04.08.2021

Coupled NEGF-PSO method for maximizing the current ratio of CNTFETs based on oxide thickness optimization

verfasst von: Amin Ghasemi Nejad Raeini, Zoheir Kordrostami, Samaneh Hamedi

Erschienen in: Journal of Computational Electronics | Ausgabe 5/2021

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Abstract

A method for designing carbon nanotube field-effect transistors (CNTFETs) with optimized oxide thickness is proposed herein. The optimum oxide thickness that provides the maximum current ratio (on/off ratio) is calculated for each design. The effect of oxide thickness on the on/off ratio is investigated by treating it as the independent variable and calculating the on-state and off-state currents. Particle swarm optimization is used to determine the exact optimum oxide thickness to achieve the maximum current ratio, which is one of the most important parameters in switching applications. The optimum insulator thickness is calculated for CNTFETs with different chiral vectors, insulator types, channel lengths and source/drain doping levels. For further study of the CNTFETs, performance parameters including cutoff frequency and transconductance of the devices are also calculated and investigated. The results show that CNTFET designers should select the oxide thickness very carefully, not simply based on reported values in other works. Each design requires its own optimum oxide thickness which provides the maximum on/off current ratio only for that design.

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Metadaten
Titel
Coupled NEGF-PSO method for maximizing the current ratio of CNTFETs based on oxide thickness optimization
verfasst von
Amin Ghasemi Nejad Raeini
Zoheir Kordrostami
Samaneh Hamedi
Publikationsdatum
04.08.2021
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 5/2021
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-021-01743-2

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