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Erschienen in:
1981 | OriginalPaper | Buchkapitel
Data Base
verfasst von : Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
Erschienen in: Scanning Electron Microscopy and X-Ray Microanalysis
Verlag: Springer US
Enthalten in: Professional Book Archive
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In order to calculate basic range equations (Chapter 3) and various quantitative x-ray correction schemes (Chapters 7 and 8), the analyst must have at hand the necessary input parameters. This chapter contains various tables (listed below) which include such data as atomic number, atomic weight, density, common oxides (atomic and weight fraction), mass absorption coefficients, and characteristic x-ray line energies. Also included are the J, ω, and R factors for quantitative ZAF corrections. To aid in the selection of coating materials, a compilation of important properties of selected elements is included.