Skip to main content
Erschienen in: Microsystem Technologies 4/2017

10.05.2016 | Technical Paper

Digital output ROIC with single slope ADC for cooled infrared applications

verfasst von: Fatih Akyurek, Baris Bayram

Erschienen in: Microsystem Technologies | Ausgabe 4/2017

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

The objective of this research is to develop an ADC stage integrated into ROIC which enables ROIC to have digital output. Digital output method isolates noise caused by outside mediums. At the system level, removal of the ADC proximity card reduces system complexity and volume of the IDDCA system which is important for avionic and missile applications. It also reduces the system cost associated with external ADC components. A digital output ROIC utilizing single slope ADC is fabricated using 0.18 µm CMOS technology. ADC has been proven to be functional, and infrared images are sampled with the fabricated ROIC and a LWIR detector. Implemented ADC has 12 bits of resolution supporting 27 kS/s sampling speed. It also has programmable high speed mode that extends readout speed to more than 100 kS/s with 10 bits resolution or 50 kS/s with 11 bits resolution. Power consumption is less than 40 µW per column ADC.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
Zurück zum Zitat Azaïs F, Bernard S, Bertrand Y, Michel X, Renovell M (2001) A low-cost adaptive ramp generator for analog BIST applications. IEEE VTS, pp 266–271 Azaïs F, Bernard S, Bertrand Y, Michel X, Renovell M (2001) A low-cost adaptive ramp generator for analog BIST applications. IEEE VTS, pp 266–271
Zurück zum Zitat Balagopal S, Ay S (2009) An on-chip ramp generator for single slope look ahead ramp (SSLAR) ADC. IEEE MWSCAS, pp 373–376 Balagopal S, Ay S (2009) An on-chip ramp generator for single slope look ahead ramp (SSLAR) ADC. IEEE MWSCAS, pp 373–376
Zurück zum Zitat Decaens G et al (2009) Ultra low power ADC on chip for high performance IR detector. Proc SPIE 7298:72983H1–72983H9CrossRef Decaens G et al (2009) Ultra low power ADC on chip for high performance IR detector. Proc SPIE 7298:72983H1–72983H9CrossRef
Zurück zum Zitat Elkind S, Adin A, Nevo I, Marhasev AB (2003) Focal plane processor with a digital video output for InSb detectors. Proc SPIE 4820:751–758CrossRef Elkind S, Adin A, Nevo I, Marhasev AB (2003) Focal plane processor with a digital video output for InSb detectors. Proc SPIE 4820:751–758CrossRef
Zurück zum Zitat Guellec F et al (2007) Sigma-delta column-wise A/D conversion for cooled ROIC. Proc SPIE 6542:65423N1–65423N9CrossRef Guellec F et al (2007) Sigma-delta column-wise A/D conversion for cooled ROIC. Proc SPIE 6542:65423N1–65423N9CrossRef
Zurück zum Zitat Liu Y (2012) The design of a high dynamic range CMOS image sensor in 110 nm technology. Dissertation for the degree of Master of Science, Delft University of Technology Liu Y (2012) The design of a high dynamic range CMOS image sensor in 110 nm technology. Dissertation for the degree of Master of Science, Delft University of Technology
Zurück zum Zitat Matsuo S, Bales TJ, Shoda M, Osawa S, Kawamura K, Andersson A, Haque M, Honda H, Almond B, Mo Y, Gleason J, Chow T, Takayanagi I (2009) 8.9-Megapixel video image sensor with 14-b column-parallel SA-ADC. IEEE Trans Electron Devices 56(11):2380–2389CrossRef Matsuo S, Bales TJ, Shoda M, Osawa S, Kawamura K, Andersson A, Haque M, Honda H, Almond B, Mo Y, Gleason J, Chow T, Takayanagi I (2009) 8.9-Megapixel video image sensor with 14-b column-parallel SA-ADC. IEEE Trans Electron Devices 56(11):2380–2389CrossRef
Zurück zum Zitat Nesher O, Klipstein PC (2006) High-performance IR detectors at SCD present and future. Opto-Electron Rev 14(1):61–70CrossRef Nesher O, Klipstein PC (2006) High-performance IR detectors at SCD present and future. Opto-Electron Rev 14(1):61–70CrossRef
Zurück zum Zitat Peizerat A, Rostaing JP, Zitouni N, Baier N, Guellec F, Jalby R, Tchagaspanian M (2012) An 88 dB SNR, 30 μm pixel pitch infra-red image sensor with a 2-step 16 bit A/D conversion. In: Symposium on VLSIC, pp 128–129 Peizerat A, Rostaing JP, Zitouni N, Baier N, Guellec F, Jalby R, Tchagaspanian M (2012) An 88 dB SNR, 30 μm pixel pitch infra-red image sensor with a 2-step 16 bit A/D conversion. In: Symposium on VLSIC, pp 128–129
Zurück zum Zitat Provost B, Sánchez-Sinencio E (2003) On-chip ramp generators for mixed-signal BIST and ADC self-test. IEEE JSSC 38(2):263–273 Provost B, Sánchez-Sinencio E (2003) On-chip ramp generators for mixed-signal BIST and ADC self-test. IEEE JSSC 38(2):263–273
Zurück zum Zitat Snoeij MF, Theuwissen AJP, Huijsing JH (2005) A 1.8 V 3.2 μW comparator for use in a CMOS imager column-level single-slope ADC. IEEE ISCAS 6:6162–6165 Snoeij MF, Theuwissen AJP, Huijsing JH (2005) A 1.8 V 3.2 μW comparator for use in a CMOS imager column-level single-slope ADC. IEEE ISCAS 6:6162–6165
Zurück zum Zitat Takayanagi I, Nakamura J (2013) High resolution CMOS video sensors. Proc IEEE 101(1):61–73CrossRef Takayanagi I, Nakamura J (2013) High resolution CMOS video sensors. Proc IEEE 101(1):61–73CrossRef
Zurück zum Zitat Theuwissen A (2008) CMOS image sensors state-of-the-art and future perspectives. Solid State Electron 52(9):1401–1406CrossRef Theuwissen A (2008) CMOS image sensors state-of-the-art and future perspectives. Solid State Electron 52(9):1401–1406CrossRef
Zurück zum Zitat Zécri M, Maillart P, Sanson E, Decaens G, Lefoul X, Baud L (2008) Advanced ROICs design for cooled IR detectors. Proc SPIE 6940:69402X1–69402X12CrossRef Zécri M, Maillart P, Sanson E, Decaens G, Lefoul X, Baud L (2008) Advanced ROICs design for cooled IR detectors. Proc SPIE 6940:69402X1–69402X12CrossRef
Metadaten
Titel
Digital output ROIC with single slope ADC for cooled infrared applications
verfasst von
Fatih Akyurek
Baris Bayram
Publikationsdatum
10.05.2016
Verlag
Springer Berlin Heidelberg
Erschienen in
Microsystem Technologies / Ausgabe 4/2017
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-016-2963-7

Weitere Artikel der Ausgabe 4/2017

Microsystem Technologies 4/2017 Zur Ausgabe

Neuer Inhalt