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Erschienen in:
2005 | OriginalPaper | Buchkapitel
Lightweight Defect Localization for Java
verfasst von : Valentin Dallmeier, Christian Lindig, Andreas Zeller
Erschienen in: ECOOP 2005 - Object-Oriented Programming
Verlag: Springer Berlin Heidelberg
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A common method to localize defects is to compare the
coverage
of passing and failing program runs: A method executed only in failing runs, for instance, is likely to point to the defect. However, some failures, occur only after a specific
sequence
of method calls, such as multiple deallocations of the same resource. Such sequences can be collected from arbitrary Java programs at low cost; comparing object-specific sequences predicts defects better than simply comparing coverage. In a controlled experiment, our technique pinpointed the defective class in 39% of all test runs.