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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 9/2016

12.05.2016

Effect of electric field direction and substrate roughness on three-dimensional self-assembly growth of copper oxide nanowires

verfasst von: Ştefan Ţălu, Shahram Solaymani, Miroslaw Bramowicz, Slawomir Kulesza, Atefeh Ghaderi, Samaneh Shahpouri, Seyed Mohammad Elahi

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2016

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Abstract

This paper analyses the three-dimensional (3-D) surface texture of Copper oxide nanowires grown on different substrates and in an electric field. Atomic force microscopy, X-ray diffraction and field emission scanning electron microscopy analyses were applied also to characterize the 3-D surface texture data in connection with the statistical, and fractal analyses. This type of 3-D morphology allows a deeper understanding of structure/property relationships and studies the effect of micromorphology on CuO nanowires grown in electric field and the impact of growth direction on their properties. It also provides a compact representation of complex micromorphology information.
Vorheriger Artikel Effects of dwell time on dielectric properties and diffuse phase transition behavior of Li2CO3 doped BaZr0.2Ti0.8O3 ceramic
Nächster Artikel Synthesis of CoFe2O4/RGO nanocomposites by click chemistry and electromagnetic wave absorption properties

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Metadaten
Titel
Effect of electric field direction and substrate roughness on three-dimensional self-assembly growth of copper oxide nanowires
verfasst von
Ştefan Ţălu
Shahram Solaymani
Miroslaw Bramowicz
Slawomir Kulesza
Atefeh Ghaderi
Samaneh Shahpouri
Seyed Mohammad Elahi
Publikationsdatum
12.05.2016
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 9/2016
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-4965-8

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