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Erschienen in:
30.04.2016
Enhanced dielectric and piezoelectric properties of (100) oriented Bi0.5Na0.5TiO3–BaTiO3–SrTiO3 thin films
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2016
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Abstract
The (100) oriented and random oriented 0.755Bi0.5Na0.5TiO3–0.065BaTiO3–0.18SrTiO3 (BNT–BT–ST) thin films were deposited on LaNiO3 (LNO) buffered Pt(111)/Ti/SiO2/Si substrates by the sol–gel processing technique. The orientation is controlled by the concentration of solution. The structure, dielectric and piezoelectric properties of the thin films are significantly affected by the crystallographic orientation. The (100) oriented BNT–BT–ST thin film has improved dielectric and piezoelectric properties. For the (100) oriented and random oriented BNT–BT–ST thin films, the dielectric constants are 660 and 550, the dielectric losses are 0.045 and 0.076 and the effective piezoelectric coefficients are 140 and 110 pm/V, respectively. The large piezoelectric response is attributed to the uniform microstructure and increased lattice distortion along (100) direction.