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Erschienen in:
01.10.2014
Enhanced multiferroic and dielectric properties of Sr2+-doped BiFe0.94(Mn0.04Cr0.02)O3 thin films
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 10/2014
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Abstract
Sr2+-doped B1−xSrxFe0.94(Mn0.04Cr0.02)O3 (B1−xSrxFMC, x = 0.00, 0.05 and 0.09) thin films were prepared on FTO/glass (SnO2: F) substrates by using a sol–gel spin-coating method. X-ray diffraction (XRD), Rietveld refined XRD data and Raman scattering spectra illustrate a structural evolution from trigonal (R3c: H) to tetragonal (P4) occurs in B1−xSrxFMC thin films with the increase of Sr2+ concent. Superiorly multiferroic and dielectric properties were obtained in the B1−xSrxFMC thin films, e.g., large remanent polarization value, a high dielectric constant (P
r = 139.21 μC/cm2 and εr = 396.7 for x = 0.09) and large saturation magnetization (M
s = 2.08 emu/cm3 for x = 0.05). The leakage current density of B1−xSrxFMC thin films is increased with increasing Sr2+ concentration, wherein the leakage current density of all the B1−xSrxFMC films is of the order of magnitude of 10−5 A/cm2, which are still lower than that in the pure BFO film (10−3 A/cm2).