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Erschienen in: Journal of Electronic Testing 2/2016

01.04.2016

Exemplar-based Failure Triage for Regression Design Debugging

verfasst von: Zissis Poulos, Andreas Veneris

Erschienen in: Journal of Electronic Testing | Ausgabe 2/2016

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Abstract

Modern regression verification often exposes myriads of failures at the pre-silicon stage. Typically, these failures need to be properly grouped into bins, which then have to be distributed to engineers for detailed analysis. The above process is coined as failure triage, and is nowadays increasing in complexity, as the size of both design logic and verification environment continues to grow. However, it remains a predominantly manual process that can prolong the debug cycle and jeopardize time-sensitive design milestones. In this paper, we propose an exemplar-based data-mining formulation of failure triage that efficiently automates both failure grouping and bin distribution. The proposed framework maps failures as data points, applies an affinity-propagation (AP) clustering algorithm, and operates in both metric and non-metric spaces, offering complete flexibility and significant user control over the process. Experimental results show that the proposed approach groups related failures together with 87 % accuracy on the average, and improves bin distribution accuracy by 21 % over existing methods.

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Metadaten
Titel
Exemplar-based Failure Triage for Regression Design Debugging
verfasst von
Zissis Poulos
Andreas Veneris
Publikationsdatum
01.04.2016
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 2/2016
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-016-5577-1

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