Ausgabe 6/2009
Inhalt (14 Artikel)
The Equivalent of Fourier Holography at the Nanoscale
C. A. Sciammarella, L. Lamberti, F. M. Sciammarella
Evaluation of Residual Stresses Induced by Robotized Hammer Peening by the Contour Method
L. Hacini, N. Van Lê, P. Bocher
A New Method for Measuring Displacements of Micro Devices by an Optical Encoding System
E. Ben-David, O. Kanner, D. Shilo
A Procedure for Accurate One-Dimensional Strain Measurement Using the Grid Method
C. Badulescu, M. Grédiac, J. D. Mathias, D. Roux
A Piezoelectric Technique for Evaluation of Crack Closure
A. L. Gama, S. R. K. Morikawa
Measuring Strains through the Thickness of a Composite Structural Specimen Subjected to Bending
M. Mulle, R. Zitoune, F. Collombet, L. Robert, Y.-H. Grunevald
Determination of the Johnson–Cook Material Parameters Using the SCS Specimen
A. Dorogoy, D. Rittel