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2017 | OriginalPaper | Buchkapitel

3. In Situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics

verfasst von : Jose Santiso, Roberto Moreno

Erschienen in: Electro-Chemo-Mechanics of Solids

Verlag: Springer International Publishing

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Abstract

This chapter reviews the use of in-situ X-ray diffraction analyses for exploring the chemical expansion produced by oxygen stoichiometry changes in thin oxide films during oxidation and reduction, as well as the kinetics of oxygen exchange at the surface of the films. This technique has demonstated to serve as a non-invasive and very selective complementary tool for fundamental studies on mixed ionic-electronic conducting materials.

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Vorheriges Kapitel Conventional Methods for Measurements of Chemo-Mechanical Coupling

Nächstes Kapitel In-Situ Neutron Diffraction Experiments

The assumption that oxygen defects concentration profile is homogenous in the whole film thickness is not entirely true. In some cases the XRD peaks show a slight broadening after film oxidation, compared to a narrower peak attained after lower pO₂ conditions. This is an indication that the film may develop a chemical expansion profile across the thickness depending on the strain imposed by the substrate mismatch.

In this heterostructure the GDC interlayer only acts as a barrier to prevent the chemical reaction between LSCF cathode and YSZ electrolyte.

Birkholz, M. (2006). Thin film analysis by X-ray scattering. London: Wiley.

Pietsch, U., Holy, V., & Baumbach T. (2013). High-resolution X-ray scattering: From thin films to lateral nanostructures. Berlin: Springer Science & Business Media.

Ohring M. (2001). Materials science of thin films (2nd ed.,). New York: Academic Press.

Poisson, S. D. (1829). Mémoire sur l’équilibre et le movement des corps élastiques: Mém. de l’Acad. Sci. 8(357).

Perry, N. H., Bishop, S. R., & Tuller, H. L. (2014). Tailoring chemical expansion by controlling charge localization: In situ X-ray diffraction and dilatometric study of (La, Sr)(Ga, Ni) O_3−δ perovskite. Journal of Material Chemistry A, 2(44), 18906–18916.CrossRef

Donner, W., Chen, C., Liu, M., Jacobson, A. J., Lee, Y.-L., Gadre, M., et al. (2011). Epitaxial strain-induced chemical ordering in La_0.5Sr_0.5CoO_3−δ films on SrTiO₃. Chemistry of Materials, 23(4), 984–988.CrossRef

Kuru, Y., Marrocchelli, D., Bishop, S. R., Chen, D., Yildiz, B., & Tuller, H. L. (2012). Anomalous chemical expansion behavior of Pr_0.2Ce_0.8O_2−δ thin films grown by pulsed laser deposition. Journal of the Electrochemical Society, 159(11), F799–F803.CrossRef

Ozawa, M., & Loong, C.-K. (1999). In situ X-ray and neutron powder diffraction studies of redox behavior in CeO₂ ⁻containing oxide catalysts. Catalysis Today, 50(2), 329–342.CrossRef

Kuru, Y., Bishop, S. R., Kim, J. J., Yildiz, B., & Tuller, H. L. (2011). Chemomechanical properties and microstructural stability of nanocrystalline Pr-doped ceria: An in situ X-ray diffraction investigation. Solid State Ionics, 193(1), 1–4.CrossRef

10.

Valentin, O., Millot, F., Blond, E., Richet, N., Julian, A., Véron, E., et al. (2011). Chemical expansion of La_0.8Sr_0.2Fe_0.7Ga_0.3O_3−δ. Solid State Ionics, 193(1), 23–31.CrossRef

11.

Grande, T., Tolchard, J. R., & Selbach, S. M. (2012). Anisotropic thermal and chemical expansion in Sr-substituted LaMnO_3+δ: implications for chemical strain relaxation. Chemistry of Materials, 24(2), 338–345.CrossRef

12.

Perry, N. H., Kim, J. J., Bishop, S. R., & Tuller, H. L. (2015). Strongly coupled thermal and chemical expansion in the perovskite oxide system Sr(Ti, Fe)O_3−α. Journal of Material Chemistry A, 3(7), 3602–3611.CrossRef

13.

Hiraiwa, C., Han, D., Kuramitsu, A., Kuwabara, A., Takeuchi, H., Majima, M., et al. (2013). Chemical expansion and change in lattice constant of Y‐doped BaZrO₃ by hydration/dehydration reaction and final heat‐treating temperature. Journal of the American Ceramic Society, 96(3), 879–884.CrossRef

14.

Mba, J.-M. A., Croguennec, L., Basir, N. I., Barker, J., & Masquelier, Ch. (2012). Lithium insertion or extraction from/into tavorite-type LiVPO₄F: An in situ X-ray diffraction study. Journal of the Electrochemical Society, 159(8), A1171–A1175.CrossRef

15.

http://www.inel.fr

16.

Moreno, R., García, P., Zapata, J., Roqueta, J., Chaigneau, J., & Santiso, J. (2013). Chemical strain kinetics induced by oxygen surface exchange in epitaxial films explored by time-resolved x-ray diffraction. Chemistry of Materials, 25(18), 3640–3647.CrossRef

17.

Bouwmeester, H. J. M., den Otter, M. W., & Boukamp, B. A. (2004). Oxygen transport in La_0.6Sr_0.4Co_1−yFe_yO_3−δ. Journal of Solid State Electrochemistry, 8(9), 599–605.CrossRef

18.

De Souza, R. A., Kilner, J. A., & Walker, J. F. (2000). A SIMS study of oxygen tracer diffusion and surface exchange in La_0.8Sr_0.2MnO_3+δ. Materials Letters, 43(1), 43–52.CrossRef

19.

Mikkelsen, L., & Skou, E. (2001). Determination of the oxygen chemical diffusion coefficient in perovskites by a thermogravimetric method. Journal of Thermal Analysis and Calorimetry, 64(3), 873–878.CrossRef

20.

Fischer, E., & Hertz, J. L. (2012). Measurability of the diffusion and surface exchange coefficients using isotope exchange with thin film and traditional samples. Solid State Ionics, 218, 18–24.CrossRef

21.

Kubicek, M., Cai, Z., Ma, W., Yildiz, B., Hutter, H., & Fleig, J. (2013). Tensile lattice strain accelerates oxygen surface exchange and diffusion in La_1−xSr_xCoO_3−δ thin films. ACS Nano, 7(4), 3276–3286.CrossRef

22.

Kushima, A., Yip, S., & Yildiz, B. (2010). Competing strain effects in reactivity of LaCoO₃ with oxygen. Physical Review B, 82(11), 115435.CrossRef

23.

Moreno, R., Zapata, J., Roqueta, J., Bagués, N., & Santiso, J. (2014). Chemical strain and oxidation-reduction kinetics of epitaxial thin films of mixed ionic-electronic conducting oxides determined by X-ray diffraction. Journal of the Electrochemical Society, 161(11), F3046–F3051.CrossRef

24.

Lankhorst, M. H. R., Bouwmeester, H. J. M., & Verweij, H. (1997). High-temperature coulometric titration of La_1−xSr_xCoO_3−δ: Evidence for the effect of electronic band structure on nonstoichiometry behavior. Journal of Solid State Chemistry, 133(2), 555–567.CrossRef

25.

Bishop, S. R., Marrocchelli, D., Chatzichristodoulou, C., Perry, N. H., Mogensen, M. B., Tuller, H. L., et al. (2014). Implications for electrochemical energy storage and conversion devices. Annual Review of Materials Research, 44, 205–239.CrossRef

26.

Nakamura, T., Petzow, G., & Gauckler, L. J. (1979). Stability of the perovskite phase LaBO3 (B = V, Cr, Mn, Fe, Co, Ni) in reducing atmosphere I. Experimental results. Materials Research Bulletin, 14(5), 649–659.CrossRef

27.

Preis, W., Bucher, E., & Sitte, W. (2002). Oxygen exchange measurements on perovskites as cathode materials for solid oxide fuel cells. Journal of Power Sources, 106(1), 116–121.CrossRef

28.

van der Haar, L. M., den Otter, M. W., Morskate, M., Bouwmeester, H. J. M., & Verweij, H. (2002). Chemical diffusion and oxygen surface transfer of La_1−xSr_xCoO_3−δ studied with electrical conductivity relaxation. Journal of the Electrochemical Society, 149(3), J41–J46.CrossRef

29.

Chen, X. (2002). Electrical conductivity relaxation studies of an epitaxial La_0.5Sr_0.5CoO_3−δ thin film. Solid State Ionics, 146(3), 405–413.CrossRef

30.

Suntivich, J., May, K. J., Gasteiger, H. A., Goodenough, J. B., & Shao-Horn, Y. (2011). A perovskite oxide optimized for oxygen evolution catalysis from molecular orbital principles. Science, 334(6061), 1383–1385.CrossRef

31.

Burriel, M., Niedrig, C., Menesklou, W., Wagner, S. F., Santiso, J., & Ivers-Tiffée, E. (2010). BSCF epitaxial thin films: Electrical transport and oxygen surface exchange. Solid State Ionics, 181(13), 602–608.CrossRef

32.

Ingram, B. J., Eastman, J. A., Chang, K.-C., Kim, S. K., Fister, T. T., Perret, E., et al. (2012). In situ x-ray studies of oxygen surface exchange behavior in thin film La_0.6Sr_0.4Co_0.2Fe_0.8O_3−δ. Applied Physics Letters, 101(5), 051603.CrossRef

33.

Biegalski, M. D., Crumlin, E., Belianinov, A., Mutoro, E., Shao-Horn, Y., & Kalinin, S. V. (2014). In situ examination of oxygen non-stoichiometry in La_0.80Sr_0.20CoO_3−δ thin films at intermediate and low temperatures by X-ray diffraction. Applied Physics Letters, 104(16), 161910.CrossRef

34.

Hopper, E. M., Perret, E., Ingram, B. J., You, H., Chang, K. C., et al. (2015). Oxygen exchange in La_0.6Sr_0.4Co_0.2Fe_0.8O_3−δ thin-film heterostructures under applied electric potential. The Journal of Physical Chemistry C, 119(34), 19915–19921.CrossRef

35.

May, S. J., Kim, J.-W., Rondinelli, J. M., Karapetrova, E., Spaldin, N. A., Bhattacharya, A., et al. (2010). Quantifying octahedral rotations in strained perovskite oxide films. Physical Review B, 82(1), 014110.CrossRef

36.

Sandiumenge, F., Santiso, J., Balcells, L., Konstantinovic, Z., Roqueta, J., Pomar, A., et al. (2013). Competing misfit relaxation mechanisms in epitaxial correlated oxides. Physical Review Letters, 110(10), 107206.CrossRef

37.

Santiso, J., Balcells, L., Konstantinovic, Z., Roqueta, J., Ferrer, P., Pomar, A., et al. (2013). Thickness evolution of the twin structure and shear strain in LSMO films. Crystal Engineering Communication, 15(19), 3908–3918.CrossRef

38.

Gazquez, J., Bose, S., Sharma, M., Torija, M. A., Pennycook, S. J., Leighton, C., et al. (2013). Lattice mismatch accommodation via oxygen vacancy ordering in epitaxial La_0.5Sr_0.5CoO_3−δ thin films. APL Materials, 1(1), 012105.CrossRef

39.

Estradé, S., Arbiol, J., Peiró, F., Infante, I. C., Sánchez, F., Fontcuberta, J., et al. (2008). Cationic and charge segregation in La_2/3Ca_1/3MnO₃ thin films grown on (001) and (110) SrTiO₃. Applied Physics Letters, 93(11), 112505.CrossRef

40.

Zapata, J. (2016). Ph.D. thesis, Department of Physics, Autonomous University of Barcelona. http://www.tdx.cat/handle/10803/368559

41.

Zapata, J., Burriel, M., García, P., Kilner, J. A., & Santiso, J. (2013). Anisotropic 18 O tracer diffusion in epitaxial films of GdBaCo₂O_5+δ cathode material with different orientations. Journal of Materials Chemistry A, 1(25), 7408–7414.CrossRef

Titel: In Situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics
verfasst von: Jose Santiso
Roberto Moreno
Verlag: Springer International Publishing
Buch: Electro-Chemo-Mechanics of Solids
Print ISBN: 978-3-319-51405-5

Electronic ISBN: 978-3-319-51407-9

Copyright-Jahr: 2017
DOI: https://doi.org/10.1007/978-3-319-51407-9_3

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