1996 | OriginalPaper | Buchkapitel
Introduction
verfasst von : Jitendra B. Khare, Wojciech Maly
Erschienen in: From Contamination to Defects, Faults and Yield Loss
Verlag: Springer US
Enthalten in: Professional Book Archive
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Over the years, there has been a large increase in functionality available on a single integrated circuit. From 2,300 transistors on a chip in 1971 [1], the state-of-the art designs of today have progressed to about 5 million transistors [2], [3]. The number of transistors on a single die has approximately doubled every two years, as predicted by Moore’s law [4].